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Figure 4. Switching time test circuit |
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|  MIL-M-38510/203E
NOTES:
1. Test table for devices programmed in accordance with an altered item drawing may be replaced by the equivalent tests
which apply to the specific program configuration for the resulting read-only memory
2. CL = 30 pF minimum, including jig and probe capacitance, R1 =330 Ω 25%, and R2 = 680 Ω 20%.
3. Outputs may be under load simultaneously.
FIGURE 4. Switching time test circuit.
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