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| TABLE III. Group A inspection for device type 03. Continued. 1/
MIL-
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Subgroup Symbol
STD-
A,B,C,D
Measured
Unit
Test limits
883
terminal
Min
Max
method
Q2
Q1
Test no.
Clock 1 Clear 1
K1
VCC
Clock 2 Clear 2
J2
Q2
K2
GND
Q1
J1
OUT
2.4 V
Clock1/Q1
GND
10
tPLH
3003 108 CKT A
IN
J
2.4 V
5.0 V
10
125
ns
TC=+125C
Clock1/Q1
OUT
"
"
"
"
"
"
(Fig. 7) 108 CKT B
"
65
"
Clock1/Q1
OUT
"
"
"
"
"
"
109 CKT A
"
125
"
Clock1/Q1
"
OUT
"
"
"
"
"
109 CKT B
"
65
"
Clock2/Q2
OUT
2.4 V
"
2.4 V
"
IN
J
110 CKT A
"
125
"
Clock2/Q2
"
OUT
"
"
"
110 CKT B
"
"
"
"
65
"
"
"
"
"
OUT
111 CKT A
"
Clock2/Q2
"
125
"
"
"
"
"
"
111 CKT B
"
"
"
65
"
Clock2/Q2
200
"
Clock2/Q2
tPHL
112 CKT A
"
"
"
"
"
"
"
85
"
Clock2/Q2
112 CKT B
"
"
"
"
"
"
"
Clock2/Q2
200
"
113 CKT A
"
"
"
"
OUT
"
"
Clock2/Q2
85
"
113 CKT B
"
"
"
"
OUT
"
"
Same tests, terminal conditions, and limits as for subgroup 10, except TC = -55C.
11
NOTE:
A = normal clock pulse, B = momentary GND, then 4.5 V, E = momentary GND, then open.
F = momentary 4.5 V, then GND. J = input pulse, tp ≥ 100 ns, PRR = 0.5 MHz, VOL = 0 V, VOH = 4.5 V.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
1/
2/
Tests shall be performed in sequence.
3/
Output voltages shall be either: (a) H = 2.4 V, minimum and L = 0.4 V, maximum when using a high speed checker double comparator; or
(b) H ≥ 1.5 V and L ≤ 1.5 V when using a high speed checker single comparator.
4/
Input voltages shown are: A = 2.4 V minimum and B = 0.4 V maximum.
5/
fMAX, minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.
*
These tests are performed at device manufacturer's option.
Test time limit ≤ 100 ns.
**
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