Microcircuits, Digital, Bipolar, High-Speed, TTL, Flip-Flops Monolithic Silicon

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Microcircuits, Digital, Bipolar, High-Speed, TTL, Flip-Flops Monolithic Silicon

Microcircuits, Digital, Bipolar, High-Speed, TTL, Flip-Flops Monolithic Silicon
Recommended operating conditions
Manufacturer eligibility
Table 1. Electrical performance characteristics
Table 1. Electrical performance characteristics-cont.
Qualification inspection
Inspection of preparation for delivery
Generic test data
Figure 1. Terminal connections
Figure 1. Terminal connections device type 03
Figure 1. Terminal connections device type 05
Figure 2. Truth table
Figure 2. Truth table device type 04
Figure 2. Truth table device type 05
Figure 3. Burn-in and life-test circuits
Figure 3. Burn-in and life-test circuits device type 03
Figure 3. Burn-in and life-test circuits device type 04
Figure 3. Burn-in and life-test circuits device type 05
Figure 3. Burn-in and life-test circuits device type 06
Figure 4. Clear and preset switching test circuit and waveforms for device type 01
Figure 5. Synchronous switching test circuit for device type 01
Figure 6. Clear switching test circuit and waveforms for device type 02
Figure 7. Syncronous switching test circuit for device type 02
Figure 8. Clear and preset switching test circuit and waveforms for device type 03
Figure 9. Synchronous switching test circuit (high-level) for device type 03
Figure 10. Synchronous switching test (low-level data) for device type 03
Figure 11. Clear and preset switching test circuit and waveforms for device type 04
Figure 12. Synchronous switching test circuit for device type 04
Figure 13. Preset switching test circuit and waveforms for device type 05
Figure 14. Synchronous switching test circuit for device type 05
Figure 15. Clear switching test circuit and waveforms for device type 06
Figure 16. Synchronous switching test circuit for device type 06
Table 3. Group A inspection for device type 01
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 02
Table 3. Group A inspection for device type 02-cont.
Table 3. Group A inspection for device type 02-cont.
Table 3. Group A inspection for device type 03
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 04
Table 3. Group A inspection for device type 04-cont.
Table 3. Group A inspection for device type 04-cont.
Table 3. Group A inspection for device type 05
Table 3. Group A inspection for device type 05-cont.
Table 3. Group A inspection for device type 05-cont.
Table 3. Group A inspection for device type 06
Table 3. Group A inspection for device type 06-cont.
Table 3. Group A inspection for device type 06-cont.
Ordering guidance
Standardization Document Improvement Proposal
Instructions

Microcircuits, Digital, Bipolar, High-Speed, TTL, Flip-Flops Monolithic Silicon

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