Microcircuits, Memory, Digital, NMOS, 16384 BIT Dynamic Random Access Memory (DRAM), Monolithic Silicon

• Microcircuits, Memory, Digital, NMOS, 16384 BIT Dynamic Random Access Memory (DRAM), Monolithic Silicon
• Alphanumeric induced error rate
• Schematic circuits and bit address maps
• Table 1. Electrical performance characteristics
• Table 1. Electrical performance characteristics-cont.
• Table 1. Electrical performance characteristics-cont.
• Table 1. Electrical performance characteristics-cont.
• Table 1. Electrical performance characteristics-cont.
• Figure 1. Case outline Z (.360" x .290" x .048") leadless chip carrier package
• Figure 2. Terminal connections
• Figure 3. Block diagram
• Figure 4. Truth table
• Figure 5. Burn-in and steady state life test circuit-cont.
• Figure 6. Switching time test circuits
• Figure 7. Read cycle waveforms
• Figure 8. Write cycle waveforms
• Figure 9. Read/write, read modify write cycle waveform
• Figure 10. "RAS-ONLY" refresh cycle waveforms
• Figure 11. Page mode read cycle waveforms
• Figure 12. Page mode write cycle waveforms
• Table 3. Group A inspection for device types 01, 02, and 03
• Table 3. Group A inspection for device types 01, 02, and 03-cont.
• Table 3. Group A inspection for device types 01, 02, and 03-cont.
• Table 3. Group A inspection for device types 01, 02, and 03-cont.
• Table 3. Group A inspection for device types 04 and 05
• Table 3. Group A inspection for device types 04 and 05-cont.
• Table 3. Group A inspection for device types 04 and 05-cont.
• Table 3. Group A inspection for device types 04 and 05-cont.
• Quality Assurance Provisions
• Electrostatic discharge sensitivity qualification inspection
• Group A inspection
• Acquisition requirements
• Logistic support
• Application and operation guidelines
• Refresh operations
• Appendix. Functional Algorithms
• Static Refresh (Periphery Retention)
• Refresh Test (Cell Retention)
• Output High Impedance
• Concluding Material
• Blank Page

Microcircuits, Memory, Digital, NMOS, 16384 BIT Dynamic Random Access Memory (DRAM), Monolithic Silicon

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