 |
|||
|
|
|||
| ||||||||||
|
|  MIL-M-38510/304C
1.3 Absolute maximum ratings.
Supply voltage range ............................................................................. -0.5 V dc to +7.0 V dc
Input voltage range ................................................................................ -1.5 V dc at -18 mA to +5.5 V dc
Storage temperature range .................................................................... -65 to +150C
Maximum power dissipation, (PD) 1/ :
Device type 01 ................................................................................. 16 mW dc
Device type 02 ................................................................................. 11 mW dc
Lead temperature (soldering, 10 seconds) ............................................. +300C
Thermal resistance, junction to case (θJC):
Cases A, B, C, D, and 2 ....................................................................... (See MIL-STD-1835)
Junction temperature (TJ) 2/ ................................................................... +175C
1.4 Recommended operating conditions.
Supply voltage (VCC) .............................................................................. +4.5 V dc minimum to +5.5 V dc
maximum
Minimum high level input voltage (VIH) ................................................... 2.0 V
Maximum low level input voltage (VIL) .................................................... 0.7 V
Case operating temperature range (TC) ................................................. -55 to +125C
2. APPLICABLE DOCUMENTS
2.1 Government documents.
2.1.1 Specifications and Standards. The following specifications and standards form a part of this specification to
the extent specified herein. Unless otherwise specified, the issues of these documents shall be those listed in the
issue of the Departments of Defense Index of Specifications and Standards (DODISS) and supplement thereto, cited
in the solicitation.
SPECIFICATION
DEPARTMENT OF DEFENSE
MIL-PRF-38535 -
Integrated Circuits (Microcircuits) Manufacturing, General Specification for.
STANDARDS
DEPARTMENT OF DEFENSE
MIL-STD-883
-
Test Method Standard for Microelectronics.
MIL-STD-1835
-
Interface Standard Electronic Component Case Outlines
(Unless otherwise indicated, copies of the above specifications and standards are available from the
Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this specification and the references cited
herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws
and regulations unless a specific exemption has been obtained.
_______
1/ Must withstand the added PD due to short-circuit test (e.g., IOS) at one output for 5 seconds duration..
2/ Maximum junction temperature shall not be exceeded except in accordance with allowable short
duration burn-in screening condition in accordance with MIL-PRF-38535.
2
|
|
Privacy Statement - Press Release - Copyright Information. - Contact Us |
Click
here for thousands of PDF manuals