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Page Title:
Figure 10. Switching test circuit and waveforms for device type 07-cont. |
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|  MIL-M-38510/306E
NOTES:
1. Clock pulse characteristics: PRR ≤ 1.0 MHz, tTLH ≤ 15 ns, tTHL ≤ 6 ns, tp (clock) ≥ 20 ns.
2. Data or serial pulse characteristics: tTLH ≤ 15 ns, tTHL ≤ 6 ns, tp (serial) or tp (data)
= 30 ns, tSETUP = 20 ns, tHOLD = 10 ns.
3. Clear pulse characteristics: tTLH ≤ 15 ns, tTHL ≤ 6 ns, tp (clear) = 25 ns, except ≥ 200 ns
for tZL test.
4. Output control pulse characteristics: tTLH ≤ 15 ns, tTHL ≤ 6 ns, tp (control) ≥ 100 ns.
5. CL = 50 pF 10% for propagation delay, tZH, tZL test, and CL = 15 pF minimum (all except
QD,) for tHZ, tLZ tests except when optional load is used, CL = 50 pF 10% for all tests.
CL includes scope probe, wiring, and stray capacitance without package in test fixture.
6. All diodes are 1N3064, 1N916, or equivalent.
7. RL = 680 Ω 5% except for QD , RL = 2 kΩ 5%.
'
8. Prior to initiating tests, the output shall be placed in the proper state.
FIGURE 10. Switching test circuit and waveforms for device type 07 - Continued.
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