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Page Title:
Table 3. Group A inspection for device type 01-cont. |
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|  TABLE III. Group A inspection for device type 01 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0; or low ≤ 0.7 V; or open).
Measured
Test Limits
Unit
MIL-STD-
Cases E, F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
terminal
Subgroup
Symbol
883
Cases 2, X
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
method
Test no.
CLR
S/R
AIN
BIN
CIN
DIN
S/L
GND
S0
S1
CLK
QD
QC
QB
QA
VCC
Min
Max
Serial
Serial
Same tests, terminal conditions, and limits as subgroup 7, except TC = 125C and -55C
8
9
fMAX
(Fig. 4)
112
G
IN
GND
G
G
IN
OUT
5.0 V
CLK to QA
22
MHz
TC = 25C
See F
and J
tPHL1
3003
113
"
IN
"
"
"
"
OUT
"
CLK TO QA
5
27
ns
(Fig. 4)
114
"
IN
"
"
"
"
OUT
"
CLK TO QB
"
"
"
115
"
IN
"
"
"
"
OUT
"
CLK TO QC
"
"
"
116
"
IN
"
"
"
"
OUT
"
CLK TO QD
"
"
"
117
"
IN
"
"
GND
"
OUT
"
CLK TO QA
"
"
"
118
"
IN
"
GND
G
"
OUT
"
CLK TO QD
"
"
"
tPHL1
119
"
IN
"
G
"
"
OUT
"
CLK TO QA
"
31
"
120
"
IN
"
"
"
"
OUT
"
CLK TO QB
"
"
"
121
"
IN
"
"
"
"
OUT
"
CLK TO QC
"
"
"
122
"
IN
"
"
"
"
OUT
"
CLK TO QD
"
"
"
123
"
IN
"
"
GND
"
OUT
"
CLK TO QA
"
"
"
124
"
IN
"
GND
G
"
OUT
"
CLK TO QD
"
"
"
tPHL2
125
IN
G
"
G
"
"
OUT
"
CLK TO QA
"
35
"
126
"
G
"
"
"
"
OUT
"
CLK TO QB
"
"
"
127
"
G
"
"
"
"
OUT
"
CLK TO QC
"
"
"
128
"
G
"
"
"
"
OUT
"
CLK TO QD
"
"
"
10
fMAX
3003
129
20
MHz
TC = 25C
See F
(Fig. 4)
and J
Same tests and terminal conditions as for subgroup 9
tPHL1
130 to 135
5
41
ns
tPHL1
136 to 141
5
47
ns
tPHL2
142 to 145
5
53
ns
Same tests, terminal conditions, and limits as subgroups 10, except TC = -55C.
11
See footnotes at end of device type 01.
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