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Page Title:
Table 3. Group A inspection for device type 02-cont. |
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|  TABLE III. Group A inspection for device type 02 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0; or low ≤ 0.7 V; or open).
MIL-STD- Cases E, F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Measured
Test Limits
Unit
terminal
Subgroup Symbol
883
Cases 2, X
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
AIN
QD
QC
QB
QA
VCC
method
Test no.
CLR
J
BIN
CIN
DIN
GND
Shift
CLK
Min
Max
K
QD
Load
1
IIL1
3009
38
0.4 V
GND
5.5 V
CLR
2/
2/
mA
Tc = 25C
39
B
0.4 V
"
4.5 V
"
J
"
"
"
40
B
0.4 V
"
4.5 V
1/
"
"
"
"
K
A or B
41
0.4 V
"
GND
"
AIN
"
"
"
42
0.4 V
"
"
"
BIN
"
"
"
43
0.4 V
"
"
"
CIN
"
"
"
44
0.4 V
"
"
"
DIN
"
"
"
45
"
0.4 V
"
Shift load
"
"
"
46
"
0.4 V
"
CLK
"
"
"
-15
-100
mA
I0S
3011
47
GND
"
4.5 V
4.5 V
GND
"
QD
48
4.5 V
4.5 V
4.5 V
4.5 V
4.5 V
"
GND
B
GND
"
QD
"
"
"
49
"
"
"
"
"
"
"
"
GND
"
QC
"
"
"
50
"
"
"
"
"
"
"
"
GND
"
QB
"
"
"
51
"
"
"
"
"
"
"
"
GND
"
QA
"
"
"
ICC
3005
52
B
"
"
"
"
"
"
4.5 V
"
VCC
21
"
3005
53
4.5 V
"
"
"
"
"
"
B
"
VCC
21
"
Same tests, terminal conditions and limits as subgroup 1, except TC = 125C, and VIC tests are omitted.
2
Same tests, terminal conditions and limits as subgroup 1, except TC = -55C, and VIC tests are omitted.
3
See footnotes at end of device type 02.
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