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Page Title:
Table 3. Group A inspection for device type 04-cont. |
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|  TABLE III. Group A inspection for device type 04 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0; or low ≤ 0.7 V; or open).
MIL-STD-
Cases E, F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Measured
Test Limits
Unit
terminal
Subgroup Symbol
883
Cases 2, X
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
method
Test no.
CLK
AIN
BIN
CIN
VCC
DIN
EIN
Enable
Serial
QE
QD
GND
QC
QB
QA
CLR
Min
Max
Same tests, terminal conditions, and limits as subgroup 7, except TC = 125C and -55C
8
9
fMAX
(Fig. 7)
81
IN
5.0 V
GND
IN
GND
OUT
F
QA
20
MHz
TC = 25C see
note E
tPLH1
3003
82
"
"
"
IN
"
OUT
"
CLK TO QA
5
45
ns
(Fig. 7)
83
"
"
"
See
"
OUT
"
CLK TO QB
"
"
"
figure 7
84
"
"
"
"
OUT
"
CLK TO QC
"
"
"
85
"
"
"
OUT
"
"
CLK TO QD
"
"
"
86
"
"
"
OUT
"
CLK TO QE
"
"
"
tPLH2
87
GND
IN
"
F
"
OUT
IN
AIN TO QA
"
40
"
88
"
IN
"
"
"
OUT
"
BIN TO QB
"
"
"
89
"
IN
"
"
"
OUT
"
CIN TO QC
"
"
"
90
"
"
IN
"
OUT
"
"
DIN TO QD
"
"
"
91
"
"
IN
"
OUT
"
"
EIN TO QE
"
"
"
92
"
F
"
IN
"
OUT
"
Enable to
"
"
"
QA
93
"
F
"
"
"
OUT
"
Enable to
"
"
"
QB
94
"
F
"
"
"
OUT
"
Enable to
"
"
"
QC
95
"
"
F
"
OUT
"
"
Enable to
"
"
"
QD
96
"
"
"
F
"
OUT
"
"
Enable to
"
"
"
QE
tPHL1
97
IN
"
GND
IN
"
OUT
F
CLK TO QA
"
45
98
"
"
"
"
OUT
"
CLK TO QB
"
"
99
"
"
"
"
OUT
"
CLK TO QC
"
"
100
"
"
"
OUT
"
"
CLK TO QD
"
"
101
"
"
"
OUT
"
"
CLK to QE
"
"
tPHL2
102
GND
F
"
IN
"
OUT
IN
CLR to QA
"
60
103
"
F
"
"
"
OUT
"
CLR to QB
"
"
104
"
F
"
"
"
OUT
"
CLR to QC
"
"
105
"
"
F
"
OUT
"
"
CLR to QD
"
"
106
"
"
F
"
OUT
"
"
CLR to QE
"
"
See footnotes at end of device type 04.
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