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Page Title:
Table 3. Group A inspection for device type 05 |
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|  TABLE III. Group A inspection for device type 05.
Terminal conditions (pins not designated may be high ≥ 2.0; or low ≤ 0.7 V; or open).
MIL-STD-
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Test
A,B,C,D
883
Subgroup Symbol method Cases 2,X
2
3
4
5
8
9
10
12
13
14
16
18
19
20
Measured
Limits
Unit
BIN
QA
QB
QC
QD
GND
CLK
CLR
QE
QF
QG
QH
VCC
terminal
Min
Max
Test no.
AIN
1
VOH
3006
1
2.0 V
2.0 V
-.4 mA
GND
J 1/
2.0 V
4.5 V
QA
2.5
V
Tc = 25C
2
"
"
-.4 mA
"
" 2/
"
"
QB
"
"
3
"
"
-.4 mA
"
" 3/
"
"
QC
"
"
4
"
"
-.4 mA
"
" 4/
"
"
QD
"
"
5
"
"
"
" 5/
"
-.4 mA
"
QE
"
"
6
"
"
"
" 6/
"
-.4 mA
"
QF
"
"
7
"
"
"
" 7/
"
-.4 mA
"
QG
"
"
8
"
"
"
" 8/
"
-.4 mA
"
QH
"
"
VOL
3007
9
4 mA
"
0.7 V
"
QA
0.4
"
10
4 mA
"
"
"
QB
"
"
11
4 mA
"
"
"
QC
"
"
12
4 mA
"
"
"
QD
"
"
13
"
"
4 mA
"
QE
"
"
14
"
"
4 mA
"
QF
"
"
15
"
"
4 mA
"
QG
"
"
16
"
"
4 mA
"
QH
"
"
VIC
17
-18 mA
"
"
AIN
-1.5
"
18
-18 mA
"
"
BIN
"
"
19
"
-18 mA
"
CLK
"
"
20
"
-18 mA
"
CLR
"
"
Α
IIH1
3010
21
2.7 V
GND
"
5.5 V
AIN
20
22
GND
2.7 V
"
"
BIN
"
"
23
"
2.7 V
"
CLK
"
"
24
"
2.7 V
"
CLR
"
"
IIH2
25
5.5 V
GND
"
"
AIN
100
"
26
GND
5.5 V
"
"
BIN
"
"
27
"
5.5 V
"
CLK
"
"
28
"
5.5 V
"
CLR
"
"
IIL1
3009
29
0.4 V
4.5 V
"
"
AIN
10/
10/
mA
30
4.5 V
0.4 V
"
"
BIN
"
"
"
31
"
0.4 V
"
CLK
"
"
"
32
"
0.4 V
"
CLR
"
"
"
See footnotes at end of device type 05.
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