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Page Title:
Table 3. Group A inspection for device type 06-cont. |
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|  TABLE III. Group A inspection for device type 06 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0; or low ≤ 0.7 V; or open).
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Measured
Test Limits
Unit
MIL-STD-
A,B,C,D
terminal
Subgroup Symbol
883
Cases 2, X
2
3
4
5
8
9
10
12
13
14
16
18
19
20
method
Test no.
Serial
AIN
BIN
CIN
DIN
Mode
GND
CONT
CLK
QD
QC
QB
QA
VCC
Min
Max
1
IIL1
3009
43
0.4 V
GND
"
5.5 V
Serial
1/
1/
mA
Tc = 25C
44
0.4 V
4.5 V
"
"
AIN
"
"
"
45
0.4 V
"
"
"
BIN
"
"
"
46
0.4 V
"
"
"
CIN
"
"
"
47
0.4 V
"
"
"
DIN
"
"
"
48
0.4 V
"
"
Mode
"
"
"
49
"
0.4 V
"
CONT
"
"
"
50
"
0.4 V
"
CLK
"
"
"
I0S
3011
51
4.5 V
4.5 V
"
4.5 V
A
GND
"
QA
2/
2/
"
52
4.5 V
"
"
"
"
GND
"
QB
"
"
"
53
4.5 V
"
"
"
"
GND
"
QC
"
"
"
54
4.5 V
"
"
"
"
GND
"
QD
"
"
"
ICC
3005
55
5.5 V
GND
GND
GND
GND
5.5 V
"
5.5 V
"
"
VCC
27
"
ICC
3005
56
5.5 V
GND
GND
GND
GND
5.5 V
"
GND
GND
"
VCC
29
"
Same tests, terminal conditions and limits as subgroup 1 except TC = 125C and VIC tests are omitted.
2
Same tests, terminal conditions and limits as subgroup 1 except TC = -55C and VIC tests are omitted.
3
See footnotes at end of device type 06.
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