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Page Title:
Table 3. Group A inspection for device type 07-cont. |
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|  TABLE III. Group A inspection for device type 07 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.7 V; or open).
MIL-STD-
Cases E, F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
14
Measured
Limits
Unit
terminal
Subgroup
Symbol
883
Cases 2, X
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
method
Test no.
CLK
Serial
AIN
BN
CIN
DIN
Load
GND
CONT
CLK
QD'
QD
QC
QB
QA
VCC
Min
Max
9
tPHL2
3003
109
IN
J
J
GND
GND
IN
OUT
5.0 V
CLR to QA
5
37
ns
TC = 25C
(Fig. 10)
110
"
J
"
"
"
"
OUT
"
CLR to QB
"
"
"
111
"
J
"
"
"
"
OUT
"
CLR to QC
"
"
"
112
"
J
"
"
"
"
OUT
"
CLR to QD
"
"
"
113
"
J
"
"
"
"
OUT
"
CLR to QD'
"
"
"
tZL
114
"
"
IN
OUT
"
CONT to QA
"
35
"
115
"
"
"
OUT
"
CONT TO QB
"
"
"
116
"
"
"
OUT
"
CONT TO QC
"
"
"
117
"
"
"
OUT
"
CONT TO QD
"
"
"
tZH
118
J
J
J
"
"
IN
OUT
"
CONT TO QA
"
"
"
119
"
J
"
"
"
"
OUT
"
CONT TO QB
"
"
"
120
"
J
"
"
"
"
OUT
"
CONT TO QC
"
"
"
121
"
J
"
"
"
"
OUT
"
CONT TO QD
"
"
"
tLZ
122
GND
"
"
OUT
"
CONT TO QA
"
"
"
123
"
"
"
OUT
"
CONT TO QB
"
"
"
124
"
"
"
OUT
"
CONT TO QC
"
"
"
125
"
"
"
OUT
"
CONT TO QD
"
"
"
tHZ
126
J
J
J
"
"
IN
OUT
"
CONT TO QA
"
"
"
127
"
J
"
"
"
"
OUT
"
CONT TO QB
"
"
"
128
"
J
"
"
"
"
OUT
"
CONT TO QC
"
"
"
129
"
J
"
"
"
"
OUT
"
CONT TO QD
"
"
"
10
fMAX
(Fig. 10)
130
20
MHz
TC = 125C See G
3003
131 to 140
5
56
ns
tPLH1
(Fig. 10)
"
141 to 150
"
56
tPHL1
"
"
151 to 155 Same tests and terminal conditions as for subgroup 9.
56
tPHL2
"
"
156 to 159
53
tZL
"
"
"
160 to 163
tZH
"
"
"
164 to 167
tLZ
"
"
"
tHZ
168 to 171
Same tests, terminal conditions, and limits as subgroup 10, except TC = -55C
11
See footnotes at end of device type 07.
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