Microcircuits, Digital, Low Power, Schottky TTL, Data Selector/Multiplexer with Three-State Outputs, Cascadable, Monolithic Silicon

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Microcircuits, Digital, Low Power, Schottky TTL, Data Selector/Multiplexer with Three-State Outputs, Cascadable, Monolithic Silicon

Microcircuits, Digital, Low Power, Schottky TTL, Data Selector/Multiplexer with Three-State Outputs, Cascadable, Monolithic Silicon
Recommended operating conditions
Quality Assurance Provisions
Table 1. Electrical performance characteristics
Table 1. Electrical performance characteristics-cont.
Table 1. Electrical performance characteristics-cont.
Table 1. Electrical performance characteristics-cont.
Table 1. Electrical performance characteristics-cont.
Quality conformance inspection
Figure 1. Terminal connections (top view)
Figure 1. Terminal connections (top view) Device type 07
Figure 1. Terminal connections (top view) Device type 09
Figure 1. Terminal connections (top view) Device type 02
Figure 1. Terminal connections (top view) Device type 05
Figure 1. Terminal connections (top view) Device type 08
Figure 1. Terminal connections (top view) Device type 09
Figure 2. Logic diagrams
Figure 2. Logic diagrams Device type 05
Figure 2. Logic diagrams Device type 08
Figure 2. Logic diagrams Device type 09
Figure 3. Truth tables
Figure 3. Truth tables Device type 08
Figure 3. Truth tables Device type 09
Figure 4. Burn-in and life test circuit
Figure 4. Burn-in and life test circuit Device types 02 and 08
Figure 4. Burn-in and life test circuit Device types 03, 04, 06, 07
Figure 4. Burn-in and life test circuit Device type 09
Figure 5. Switching test for device types 01, 02, 03, and 04
Figure 5. Switching test for device types 05, 06, 07, 08
Figure 5. Switching test for device types 05, 06, 07, 08 waveforms for optional load circuits
Figure 5. Switching test circuit and waveforms for device type 09
Table 3. Group A inspection for device type 01
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 02
Table 3. Group A inspection for device type 02-cont.
Table 3. Group A inspection for device type 02-cont.
Table 3. Group A inspection for device type 03
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 04
Table 3. Group A inspection for device type 04-cont.
Table 3. Group A inspection for device type 04-cont.
Table 3. Group A inspection for device type 05
Table 3. Group A inspection for device type 05-cont.
Table 3. Group A inspection for device type 05-cont.
Table 3. Group A inspection for device type 05-cont.
Table 3. Group A inspection for device type 06
Table 3. Group A inspection for device type 06-cont.
Table 3. Group A inspection for device type 06-cont.
Table 3. Group A inspection for device type 07
Table 3. Group A inspection for device type 07-cont.
Table 3. Group A inspection for device type 07-cont.
Table 3. Group A inspection for device type 08
Table 3. Group A inspection for device type 08-cont.
Table 3. Group A inspection for device type 08-cont.
Table 3. Group A inspection for device type 09
Table 3. Group A inspection for device type 09-cont.
Ordering data
Table 4. Manufacturers' designation
Custodians
Instructions
Standardization Document Improvement Proposal

Microcircuits, Digital, Low Power, Schottky TTL, Data Selector/Multiplexer with Three-State Outputs, Cascadable, Monolithic Silicon

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