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|  MIL-M-38510/310D
1.3 Absolute maximum ratings.
Supply voltage range .............................................................................
-0.5 V to +7.0 V
Input voltage range ................................................................................
-1.5 V at -18 mA to +5.5 V
-65 to +150C
Storage temperature range ....................................................................
Maximum power dissipation, (PD) 1/:
Device types 01 and 02 ........................................................................
36 mW
Device type 03 .....................................................................................
24.2 mW
Device types 04 and 05 ........................................................................
48.4 mW
300C
Lead temperature (soldering, 10 seconds) .............................................
Thermal resistance, junction to case (θJC):
Cases A, B, C, D, X and 2.....................................................................
See MIL-STD-1835
175C 2/
Junction temperature (TJ) .......................................................................
1.4 Recommended operating conditions.
Supply voltage (VCC) ..............................................................................
4.5 V minimum to 5.5 V maximum
Minimum high level input voltage (VIH) ...................................................
2.0 V
Maximum low level input voltage (VIL) ....................................................
0.7 V
-55 to +125C
Case operating temperature range (TC) .................................................
2. APPLICABLE DOCUMENTS
2.1 Government documents.
2.1.1 Specifications and Standards. The following specifications and standards form a part of this
specification to the extent specified herein. Unless otherwise specified, the issues of these documents shall be
those listed in the issue of the Department of Defense Index of Specifications and Standards (DODISS) and
supplement thereto, cited in the solicitation.
SPECIFICATION
DEPARTMENT OF DEFENSE
MIL-M-38510
-
Microcircuits, General Specification for.
MIL-PRF-38535
-
Integrated Circuits (Microcircuits) Manufacturing, General Specification for.
STANDARD
DEPARTMENT OF DEFENSE
MIL-STD-883 - Test Method Standard for Microelectronics.
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines
(Unless otherwise indicated, copies of the above specifications and standards are available from the
Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this specification and the references cited
herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws
and regulations unless a specific exemption has been obtained.
_______
1/ Must withstand the added PD due to short-circuit test (e.g., IOS).
2/ Maximum junction temperature (TJ) may be increased during the burn-in screening and steady-state life
test. However, such temperatures should not be used under normal operating conditions.
2
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