Microcircuits, Digital, Bipolar, Low-Power Schottky, TTL, Octal Buffer Gates with Three-State Outputs, Monolithic Silicon

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Microcircuits, Digital, Bipolar, Low-Power Schottky, TTL, Octal Buffer Gates with Three-State Outputs, Monolithic Silicon

Microcircuits, Digital, Bipolar, Low-Power Schottky, TTL, Octal Buffer Gates with Three-State Outputs, Monolithic Silicon
Absolute maximum ratings
Schematic circuits
Table 1. Electrical performance characteristics
Table 2. Electrical test requirements
Figure 1. Logic diagrams and terminal connections (top view)
Figure 1. Logic diagrams and terminal connections (top view) Device type 05
Figure 2. Truth tables
Figure 3. Burn-in and life-test circuit for device types 01, 02, 03, 04, and 05
Figure 3. Burn-in and life-test circuit for device types 01, 02, 03, 04, and 05-cont.
Figure 4. Switching time test circuit and waveforms for device types 01, 02, 03, 04, and 05
Figure 4. Switching time test circuit and waveforms for device types 01, 02, 03, 04, and 05-cont.
Table 3. Group A inspection for device type 01
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 02 and 03
Table 3. Group A inspection for device type 02 and 03-cont.
Table 3. Group A inspection for device type 02 and 03-cont.
Table 3. Group A inspection for device type 02 and 03-cont.
Table 3. Group A inspection for device type 02 and 03-cont.
Table 3. Group A inspection for device type 02 and 03-cont.
Table 3. Group A inspection for device type 04 and 05
Table 3. Group A inspection for device type 04 and 05-cont.
Table 3. Group A inspection for device type 04 and 05-cont.
Table 3. Group A inspection for device type 04 and 05-cont.
Table 3. Group A inspection for device type 04 and 05-cont.
Table 3. Group A inspection for device type 04 and 05-cont.
Table 3. Group A inspection for device type 04 and 05-cont.
Inclusion with other detail specifications
Ordering data
Logistic support
Instructions
Standardization Document Improvement Proposal
Custodians

Microcircuits, Digital, Bipolar, Low-Power Schottky, TTL, Octal Buffer Gates with Three-State Outputs, Monolithic Silicon

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