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| TABLE III. Group A inspection for device type 04.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.7 V; or open).
Subgroup
Symbol
MIL-STD-
883
Case L
13
14
15
16
17
18
19
20
21
22
23
24
Measured
Test Limits
Unit
SEL BA
CLK BA
method
Test no.
B8
B7
B6
B5
B4
B3
B2
B1
VCC
terminal
Min
Max
G
A
1
IIH2
3010
115
5.5 V
CAB
100
Tc = 25C
"
116
"
SAB
"
"
"
117
"
DIR
"
"
"
118
"
A1
"
"
"
119
"
A2
"
"
"
120
"
A3
"
"
"
121
"
A4
"
"
"
122
"
A5
"
"
"
123
"
A6
"
"
"
124
"
A7
"
"
"
125
"
A8
"
"
"
126
5.5 V
"
B8
"
"
"
127
5.5 V
"
B7
"
"
"
128
5.5 V
"
B6
"
"
"
129
5.5 V
"
B5
"
"
"
130
5.5 V
"
B4
"
"
"
131
5.5 V
"
B3
"
"
"
132
5.5 V
"
B2
"
"
"
133
5.5 V
"
B1
"
"
"
134
5.5 V
"
"
"
G
"
135
5.5 V
"
SBA
"
"
"
136
5.5 V
"
CBA
"
"
IOZL
137
2.0 V
"
A1
-400
"
138
"
"
A2
"
"
139
"
"
A3
"
"
140
"
"
A4
"
"
141
"
"
A5
"
"
142
"
"
A6
"
"
143
"
"
A7
"
"
144
"
"
A8
"
"
145
0.4 V
"
"
B8
"
"
146
0.4 V
"
"
B7
"
"
147
0.4 V
"
"
B6
"
"
148
0.4 V
"
"
B5
"
"
149
0.4 V
"
"
B4
"
"
150
0.4 V
"
"
B3
"
"
151
0.4 V
"
"
B2
"
"
152
0.4 V
"
"
B1
"
"
IOZH
153
"
"
A1
20
"
154
"
"
A2
"
"
155
"
"
A3
"
"
156
"
"
A4
"
"
157
"
"
A5
"
"
158
"
"
A6
"
"
159
"
"
A7
"
"
160
"
"
A8
"
"
161
2.7 V
"
"
B8
"
"
162
2.7 V
"
"
B7
"
"
163
2.7 V
"
"
B6
"
"
164
2.7 V
"
"
B5
"
"
165
2.7 V
"
"
B4
"
"
166
2.7 V
"
"
B3
"
"
167
2.7 V
"
"
B2
"
"
168
2.7 V
"
"
B1
"
"
See footnotes at end of device type 04.
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