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Page Title:
Table 3. Group A inspection for device type 04-cont. |
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|  TABLE III. Group A inspection for device type 04.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.7 V; or open).
Subgroup
Symbol
MIL-STD-
883
Case L
1
2
3
4
5
6
7
8
9
10
11
12
Measured
Test Limits
Unit
method
Test no.
CLK AB
SEL AB
DIR
A1
A2
A3
A4
A5
A6
A7
A8
GND
terminal
Min
Max
10
tPLH1
2
39
ns
Tc = 125C
tPHL1
"
52
"
tPLH2
"
30
"
tPHL2
"
33
"
tPLH3
"
59
"
tPHL3
"
52
"
tPLH4
"
72
"
tPHL4
"
39
"
Same tests and terminal conditions as subgroup 9, except TC = +125C.
tPZH2
"
78
"
tPZL2
"
91
"
tPZH3
"
65
"
tPZL3
"
85
"
tPHZ2
"
52
"
tPLZ2
"
52
"
tPHZ3
"
46
"
"
46
"
tPLZ3
Same tests, terminal conditions, and limits as subgroup 10, except TC = -55C.
11
TC = -55C
TABLE III. Group A inspection for device type 04.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.7 V; or open).
Subgroup
Symbol
MIL-STD-
883
Case L
13
14
15
16
17
18
19
20
21
22
23
24
Measured
Test Limits
Unit
method
Test no.
B8
B7
B6
B5
B4
B3
B2
B1
SEL BA
CLK BA
VCC
terminal
Min
Max
G
10
tPLH1
2
39
ns
Tc = 125C
tPHL1
"
52
"
tPLH2
"
30
"
tPHL2
"
33
"
tPLH3
"
59
"
tPHL3
"
52
"
tPLH4
"
72
"
tPHL4
"
39
"
Same tests and terminal conditions as subgroup 9, except TC = +125C.
tPZH2
"
78
"
tPZL2
"
91
"
tPZH3
"
65
"
tPZL3
"
85
"
tPHZ2
"
52
"
tPLZ2
"
52
"
tPHZ3
"
46
"
tPLZ3
"
46
"
Same tests, terminal conditions, and limits as subgroup 10, except TC = -55C.
11
TC = -55C
1/
Tests shall be performed in sequence, attributes data only.
2/
H > 1.5 V; L < 1.5 V.
┌──┐
3/
A = 3.0 V minimum; B = 0.0 V or GND.
2.5 V/5.5 V);
Prior to test, bus registers are loaded high by placing 4.5 V on bus data and applying one clock pulse ( ─┘ └─
4/
0V
the bus is then placed at GND for the duration of the test.
┌──┐
2.5 V/5.5 V);
5/ Prior to test, bus registers are loaded low by placing GND on bus data and applying one clock pulse ( ─┘ └─
0V
the bus is then placed at 4.5 V for the duration of the test.
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