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Page Title:
Table 3. Group A inspection for device type 03-cont. |
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|  TABLE III. Group A inspection for device type 03.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.8 V; or open).
MIL-STD- Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
Subgroup Symbol
883
Test limits
Unit
R, S, 2
Measured
method
Test no.
A1
B1
A0
B0
S0
S1
S2
F0
F1
GND
F2
F3
terminal
Min
Max
Cn
B3
A3
B2
A2
VCC
G
P
9
tPHL10
3003
371
GND
2.7 V
GND
2.7 V
IN
2.7 V
GND
GND
OUT
GND
2.7 V
GND
2.7 V
GND
5.0 V
3.0
13.5
ns
S0 to P
Tc = 25C
Fig. 4
372
2.7 V
GND
2.7 V
GND
2.7 V
IN
GND
"
"
"
GND
2.7 V
GND
2.7 V
"
"
"
"
S1 to P
"
373
GND
GND
GND
GND
2.7 V
GND
IN
"
"
"
GND
GND
GND
GND
"
"
"
"
S2 to P
Same tests as subgroup 9, except TC = +125C and use limits from table I.
10
Same tests as subgroup 10, except TC = -55C and use limits from table I.
11
1/ IIL limits (mA) min/max values for circuit shown:
Parameter
Test no.
A
B
C
IIL1
48 - 50
-0.12/-0.6
-0.12/-0.6
IIL2
51 - 59
-0.12/-2.4
-0.12/-2.4
2/ H ≥ 1.5 V, L ≤ 1.5 V ; A = 2.5 V, B = 0.5 V.
3/ Perform function sequence at VCC = 4.5 V and repeat at VCC = 5.5 V.
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