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Page Title:
Table III. Group A inspection for device type 06-cont. |
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|  TABLE III. Group A inspection for device type 06 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.8 V; or open).
MIL-STD- Cases 2,R,
Subgroup
Symbol
1
2
3
4
5
6
7
8
9
10
883
S, and X
method
Test no.
D0
D1
D2
D3
GND
OE
Q 0
Q 1
Q 2
Q
3
1
IOS
3011
57
0V
0V
0V
"
Tc = +25C
0V
0V
"
58
"
59
"
0V
0V
"
60
"
0V
0V
"
61
"
"
62
"
"
63
"
"
64
"
"
IOD
65
0V
2.5 V
5.5 V
"
66
"
5.5 V
2.5 V
"
67
"
2.5 V
5.5 V
"
68
"
5.5 V
2.5 V
"
69
"
"
70
"
"
71
"
"
72
"
"
IOZH
3011
73
2.0 V
2.7 V
4.5 V
"
74
"
4.5 V
2.7 V
"
75
"
2.7 V
4.5 V
"
76
"
4.5 V
2.7 V
"
77
"
"
78
"
"
79
"
"
80
"
"
IOZL
3011
81
"
.5 V
0V
"
82
"
0V
.5 V
"
83
"
.5 V
0V
"
84
"
0V
.5 V
"
85
"
"
86
"
"
87
"
"
88
"
"
ICCZ
3011
89
4.5 V
4.5 V
4.5 V
4.5 V
4.5 V
"
Same tests, terminal conditions, and limits as for subgroup 1, except TC = +125C and VIC tests are omitted.
2
Same tests, terminal conditions, and limits as for subgroup 1, except TC = -55C and VIC tests are omitted.
3
See footnotes at end of device type 06.
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