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Page Title:
Table III. Group A inspection for device type 06-cont. |
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|  TABLE III. Group A inspection for device type 06 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.8 V; or open).
MIL-STD-
Cases 2, R,
11
12
13
14
15
16
17
18
19
20
Measured
Limits
Subgroup
Symbol
S, and X
883
method
Test no.
CP
D4
D5
D6
D7
VCC
terminal
Min
Max
Unit
Q
Q
Q
Q
4
5
6
7
Same tests, and terminal conditions, and limits as subgroup 9, except TC = +125C and use limits from table I.
10
Same tests, and terminal conditions, and limits as subgroup 9, except TC = -55C and use limits from table I.
11
1/
Apply all voltages, then apply 3 V, 0 V, 3 V to CP, then make measurement.
2/
IIL limits (mA) min/max values for circuits shown:
Circuits
Parameter
A
B
C
IIL1
-.25/-.60
-.03/-.60
-.03/-.60
3/
Output voltage shall be either:
A = 2.5 V
B = 0.5 V
H ≥ 1.5 V
L ≤ 1.5 V
X = Don't care
4/
Perform function sequence at VCC = 4.5 V and repeat at VCC = 5.5 V.
5/
fMAX minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.
fMAX shall be measured only under the conditions of initial qualification and after process or design changes which may affect this parameter.
For all other conditions, fMAX shall be guaranteed, if not tested, to the limits specified in table III, herein.
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