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Page Title:
Table III. Group A inspection for device type 10-cont. |
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|  TABLE III. Group A inspection for device type 10 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.8 V; or open).
MIL-STD-
Subgroup
Symbol
Cases 2, R,
13
14
15
16
17
18
19
20
Measured
Limits
S, and X
883
method
Test no.
Q6
Q5
Q4
Q3
Q2
Q1
Q0
VCC
terminal
Min
Max
Unit
1
IOS
3011
57
0.0 V
5.5 V
Q0
-60
-150
mA
Tc = +25C
Q1
"
"
"
58
0.0 V
"
59
0.0 V
"
Q2
"
"
"
60
0.0 V
"
Q3
"
"
"
61
0.0 V
"
Q4
"
"
"
62
0.0 V
"
Q5
"
"
"
63
0.0 V
"
Q6
"
"
"
64
"
Q7
"
"
"
A
IOZH
3011
65
2.7 V
"
Q0
50
66
2.7 V
"
Q1
"
"
67
2.7 V
"
Q2
"
"
68
2.7 V
"
Q3
"
"
69
2.7 V
"
Q4
"
"
70
2.7 V
"
Q5
"
"
71
2.7 V
"
Q6
"
"
72
"
Q7
"
"
IOZL
3011
73
0.5 V
"
Q0
-50
"
74
0.5 V
"
Q1
"
"
75
0.5 V
"
Q2
"
"
76
0.5 V
"
Q3
"
"
77
0.5 V
"
Q4
"
"
78
0.5 V
"
Q5
"
"
79
0.5 V
"
Q6
"
"
80
"
Q7
"
"
ICCZ
3011
81
"
VCC
90
mA
ICCL
3011
82
"
VCC
86
mA
Same tests, terminal conditions, and limits as for subgroup 1, except TC = +125C and VIC tests are omitted.
2
Same tests, terminal conditions, and limits as for subgroup 1, except TC = -55C and VIC tests are omitted.
3
7
Func-
3014
83
H
L
H
L
H
L
H
4/
All outputs
Tc = +25C tional
84
H
L
H
L
H
L
H
"
"
3/
85
H
L
H
L
H
L
H
"
"
86
H
L
H
L
H
L
H
"
"
87
H
L
H
L
H
L
H
"
"
88
L
H
L
H
L
H
L
"
"
89
L
H
L
H
L
H
L
"
"
90
L
H
L
H
L
H
L
"
"
91
L
H
L
H
L
H
L
"
"
92
L
H
L
H
L
H
L
"
"
Same tests, terminal conditions, and limits as for subgroup 7, except TC = +125C and -55C.
8
See footnotes at end of device type 10.
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