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Page Title:
Table III. Group A inspection for device type 11-cont. |
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|  TABLE III. Group A inspection for device type 11 Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.8 V; or open).
MIL-STD- Cases 2,R,
Subgroup
Symbol
1
2
3
4
5
6
7
8
9
10
11
12
883
S, and X
method
Test no.
D0
D1
D2
D3
D4
D5
D6
D7
GND
CP
OE
Q
7
1
IOS
3011
57
0.0 V
0.0 V
"
1/
Tc = +25C
0.0 V
"
"
58
"
59
"
0.0 V
"
"
60
"
0.0 V
"
"
61
"
0.0 V
"
"
62
"
0.0 V
"
"
63
"
0.0 V
"
"
64
"
0.0 V
"
"
0.0 V
IOZH
3011
65
2.0 V
0.0 V
"
"
66
"
0.0 V
"
"
67
"
0.0 V
"
"
68
"
0.0 V
"
"
69
"
0.0 V
"
"
70
"
0.0 V
"
"
71
"
0.0 V
"
"
72
"
0.0 V
"
"
2.7 V
IOZL
3011
73
"
5.5 V
"
"
74
"
5.5 V
"
"
75
"
5.5 V
"
"
76
"
5.5 V
"
"
77
"
5.5 V
"
"
78
"
5.5 V
"
"
79
"
5.5 V
"
"
80
"
5.5 V
"
"
0.5 V
"
"
ICCZ
3011
81
5.5 V
0.0 V
0.0 V
0.0 V
0.0 V
0.0 V
0.0 V
0.0 V
0.0 V
"
"
ICCL
3011
82
0.0 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
Same tests, terminal conditions, and limits as subgroup 1, except TC = +125C and VIC tests are omitted.
2
Same tests, terminal conditions, and limits as subgroup 1, except TC = -55C and VIC tests are omitted.
3
7
Func-
3014
83
B
B
A
B
A
B
A
B
A
GND
1/
L
Tc = +25C tional
84
B
A
B
A
B
A
B
A
B
"
A
L
3/
85
B
A
B
A
B
A
B
A
B
"
B
L
86
B
B
A
B
A
B
A
B
A
"
B
L
87
B
A
B
A
B
A
B
A
B
"
B
L
88
B
A
B
A
B
A
B
A
B
"
1/
H
89
B
B
A
B
A
B
A
B
A
"
A
H
90
B
B
A
B
A
B
A
B
A
"
B
H
91
B
A
B
A
B
A
B
A
B
"
B
H
92
B
B
A
B
A
B
A
B
A
"
B
H
Same tests, terminal conditions, and limits as for subgroup 7, except TC = +125C and -55C.
8
See footnotes at end of device type 11.
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