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Page Title:
Table III. Group A inspection for device type 11-cont. |
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|  TABLE III. Group A inspection for device type 11 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.8 V; or open).
MIL-STD-
Subgroup
Symbol
Cases 2, R,
13
14
15
16
17
18
19
20
Measured
Limits
S, and X
883
method
Test no.
Q6
Q5
Q4
Q3
Q2
Q1
Q0
VCC
terminal
Min
Max
Unit
9
tPZL2
3003
141
OUT
5.0 V
3.0
9.0
ns
OE to Q
Tc = +25C
0
142
OUT
"
"
"
"
OE to Q
1
143
OUT
"
"
"
"
OE to Q
2
144
OUT
"
"
"
"
OE to Q
3
145
OUT
"
"
"
"
OE to Q
4
146
OUT
"
"
"
"
OE to Q
5
147
OUT
"
"
"
"
OE to Q
6
148
"
"
"
"
OE to Q
7
Same tests as subgroup 9 except TC = +125C, and use limits from table I.
10
Same tests as subgroup 10 except TC = -55C, and use limits from table I.
11
1/ Apply all voltages then apply 3 V, 0, 3 V to CP then make measurement.
2/ IIL limits (mA) min/max values for circuits shown:
Parameter
Circuit A
IIL1
-.25/-.60
3/ A = 3.0 V minimum; B = 0.0 V or GND, H ≥ 2.5 V, L ≤ 0.5 V.
4/ Perform function sequence at VCC = 4.5 V and repeat at VCC = 5.5 V.
5/ fMAX minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.
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