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Page Title:
Table 3. Group A inspection for device type 03-cont. |
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|  TABLE III. Group A inspection for device type 03.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.8 V; or open).
MIL-STD- Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
Subgroup Symbol
883
Test limits
Unit
R,S,X,2
Measured
method
Test no.
terminal
Min
Max
A0
A1
A2
A3
A4
A5
A6
A7
GND
B7
B6
B5
B4
B3
B2
B1
B0
VCC
T/ R
OE
9
tPZH2
3003
231
2.7 V
2.7 V
GND
OUT
IN
5.0 V
2.5
8.5
ns
OE to B0
Tc = 25C
"
232
"
2.7 V
"
OUT
"
"
"
"
"
OE to B1
"
233
"
2.7 V
"
OUT
"
"
"
"
"
OE to B2
"
234
"
2.7 V
"
OUT
"
"
"
"
"
OE to B3
"
235
"
2.7 V
"
OUT
"
"
"
"
"
OE to B4
"
236
"
2.7 V
"
OUT
"
"
"
"
"
OE to B5
"
237
"
2.7 V
"
OUT
"
"
"
"
"
OE to B6
"
238
"
2.7 V
"
OUT
"
"
"
"
"
OE to B7
10
tPLH1
1.0
8.0
"
tPLH2
"
8.5
"
tPHL1
"
8.0
"
Same tests and teminal conditions as for subgroup 9, except TC = +125C and limits as shown.
tPHL2
"
8.5
"
tPLZ1
2.0
10.0
"
tPLZ2
"
10.0
"
tPHZ1
"
9.0
"
tPHZ2
"
9.0
"
tPZL1
"
13.0
"
tPZL2
"
13.0
"
tPZH1
"
11.0
"
tPZH2
"
11.0
"
Same tests as subgroup 10, except TC = -55C.
11
1/ IIL and IOZL limits shall be as follows:
Min/max limits in (mA) for circuits
Test
A
B
C
D
IOZL
-.25/-.65
-.04/-1.2
-.03/-1.0
0.0/-0.4
IIL1
-.05/-1.2
-.04/-1.2
-.06/-1.6
0.0/-0.4
IIL2
-.05/-1.2
-.04/-1.2
-.09/-1.2
0.0/-0.4
2/ A = 3.0 V minimum, B = 0.0 V or GND; H > 1.5 V, L < 1.5 V.
3/ Perform function sequence at VCC = 4.5 V and repeat at VCC = 5.5 V.
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