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Page Title:
Table 3. Group A inspection for device type 04-cont. |
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|  TABLE III. Group A inspection for device type 04.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.8 V; or open).
MIL-STD- Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
Subgroup Symbol
883
Test limits
Unit
R,S,X,2
Measured
method
Test no.
A0
A1
A2
A3
A4
A5
A6
A7
terminal
Min
Max
GND
B7
B6
B5
B4
B3
B2
B1
B0
VCC
OE
T/ R
9
tPZH2
3003
231
2.7 V
IN
GND
2.7 V
OUT
5.0 V
2.5
8.5
ns
OE to B0
Tc = 25C
"
232
2.7 V
"
"
"
OUT
"
"
"
"
OE to B1
"
233
2.7 V
"
"
"
OUT
"
"
"
"
OE to B2
"
234
2.7 V
"
"
"
OUT
"
"
"
"
OE to B3
"
235
2.7 V
"
"
"
OUT
"
"
"
"
OE to B4
"
236
2.7 V
"
"
"
OUT
"
"
"
"
OE to B5
"
237
2.7 V
"
"
"
OUT
"
"
"
"
OE to B6
"
238
2.7 V
"
"
"
OUT
"
"
"
"
OE to B7
10
tPLH1
1.0
8.0
"
tPLH2
"
8.5
"
tPHL1
"
8.0
"
Same tests and teminal conditions as for subgroup 9, except TC = +125C and limits as shown.
tPHL2
"
8.5
"
tPLZ1
2.0
10.0
"
tPLZ2
"
10.0
"
tPHZ1
"
9.0
"
tPHZ2
"
9.0
"
tPZL1
"
13.0
"
tPZL2
"
13.0
"
tPZH1
"
11.0
"
tPZH2
"
11.0
"
Same tests as subgroup 10, except TC = -55C and use limits from table I.
11
1/ IIL and IOZL limits shall be as follows:
Min/max limits in (mA) for circuits
Test
A
B
C
IOZL
-.25/-.65
-.04/-1.2
-.03/-1.0
IIL1
-.05/-1.2
-.04/-1.2
-.06/-1.6
IIL2
-.05/-1.2
-.04/-1.2
-.09/-1.2
2/ A = 3.0 V minimum, B = 0.0 V or GND; H > 1.5 V, L < 1.5 V.
3/ Perform function sequence at VCC = 4.5 V and repeat at VCC = 5.5 V.
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