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Page Title:
Table 3. Group A inspection for device type 01-cont. |
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|  TABLE III. Group A inspection for device type 01.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.8 V; or open).
MIL-STD- Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
Subgroup Symbol
883
R, S, 2
Measured
Test limits
Unit
method
Test no.
S
QA
I0A
I1A
I1B
I0B
QB
GND
CP
QC
I0C
I1C
I1D
I0D
QD
VCC
terminal
Min
Max
QA
QB
QC
QD
9
tPHL
3003
142
0.0 V
OUT
0.0 V
0.0 V
0.0 V
2.7 V
GND
IN
2.7 V
0.0 V
0.0 V
2.7 V
5.0 V
QA
1.5
9.5
ns
Tc = 25C
"
"
"
Fig. 4
143
"
OUT
2.7 V
"
"
2.7 V
"
"
"
"
"
"
"
QA
"
144
"
"
"
"
0.0 V
OUT
"
"
"
"
"
"
"
QB
"
"
"
"
145
"
"
"
"
2.7 V
OUT
"
"
"
"
"
"
"
"
"
"
QB
"
146
"
"
"
"
"
"
"
OUT
"
"
"
"
QC
"
"
"
0.0
V
"
147
"
"
"
"
"
"
"
OUT
2.7 V
"
"
"
"
"
"
"
QC
"
148
"
"
"
"
"
"
"
"
"
"
0.0 V
OUT
"
QD
"
"
"
"
149
"
"
"
"
"
"
"
"
"
"
2.7 V
OUT
"
"
"
"
QD
"
150
2.7 V
OUT
0.0 V
"
2.7 V
0.0 V
"
"
0.0 V
2.7 V
2.7 V
0.0 V
"
QA
"
"
"
"
151
"
OUT
"
2.7 V
2.7 V
"
"
"
"
"
"
"
"
"
"
"
QA
"
152
"
"
"
0.0 V
"
OUT
"
"
"
"
"
"
"
QB
"
"
"
"
153
"
"
"
2.7 V
"
OUT
"
"
"
"
"
"
"
"
"
"
QB
"
154
"
"
"
"
"
"
"
OUT
"
0.0 V
"
"
"
QC
"
"
"
"
155
"
"
"
"
"
"
"
OUT
"
2.7 V
"
"
"
"
"
"
QC
"
156
"
"
"
"
"
"
"
"
"
0.0 V
"
OUT
"
QD
"
"
"
"
157
"
"
"
"
"
"
"
"
"
2.7 V
"
OUT
"
"
"
"
QD
fMAX
3003
158
0.0 V
OUT
IN2
0.0 V
0.0 V
"
"
IN1
"
0.0 V
0.0 V
"
5.0 V
QA
100
MHz
5/
Fig. 5
159
"
OUT
IN2
"
"
"
"
"
"
"
"
"
"
"
"
QA
"
160
"
0.0 V
"
"
IN2
OUT
"
"
"
"
"
"
"
"
"
QB
"
161
"
"
"
"
IN2
OUT
"
"
"
"
"
"
"
QB
"
"
"
162
"
"
"
"
0.0 V
"
"
OUT
IN2
"
"
"
"
QC
"
"
"
163
"
"
"
"
"
"
"
OUT
IN2
"
"
"
"
"
"
QC
"
"
"
164
"
"
"
"
"
"
"
0.0 V
"
"
IN2
OUT
"
QD
"
165
"
"
"
"
"
"
"
"
"
"
IN2
OUT
"
QD
"
"
"
166
2.7 V
OUT
"
IN2
"
"
"
"
"
"
"
0.0 V
"
QA
"
"
"
"
"
167
"
OUT
"
IN2
"
"
"
"
"
"
"
"
"
QA
"
168
"
"
0.0 V
IN2
"
OUT
"
"
"
"
"
"
"
"
"
QB
"
169
"
"
"
IN2
"
OUT
"
"
"
"
"
"
"
QB
"
"
"
170
"
"
"
0.0 V
"
"
"
OUT
"
IN2
"
"
"
QC
"
"
"
171
"
"
"
"
"
"
"
OUT
"
IN2
"
"
"
"
"
QC
"
172
"
"
"
"
"
"
"
"
0.0 V
IN2
"
OUT
"
"
"
QD
"
173
"
"
"
"
"
"
"
"
0.0 V
IN2
"
OUT
"
QD
"
"
Same tests as subgroup 9, except TC = +125C and use limits from table I.
10
Same tests as subgroup 9, except TC = -55C and use limits from table I.
11
1/
Apply all voltages, then apply 3.0 V, 0.0 V, 3.0 V to CP then make measurement.
2/
Perform function sequence at VCC = 4.5 V and repeat at VCC = 5.5 V.
A = 3.0 V, B = 0.0 V or GND; H > 1.5 V, L < 1.5 V.
3/
4/
IIL limits (mA) min/max values for circuit shown:
Test
Min/Max limits in mA
CKT A
B
C
IIL
-.25/-.60
-.03/-.60
5/ fMAX shall be measured only under the conditions of initial qualification and after process or design changes which may affect this parameter.
For all other conditions, fMAX shall be guaranteed, if not tested, to the imits specified in table III, herein.
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