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Page Title:
Table 3. Group A inspection for device type 04-cont. |
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|  TABLE III. Group A inspection for device type 04.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.8 V; or open).
Subgroup
Symbol MIL-STD- Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
Measured
Limits
Unit
2, R, S
883
method Test no.
2D
3D
4D
5D
6D
7D
8D
GND
CLK
8Q
7Q
6Q
5Q
4Q
3Q
2Q
1Q
VCC
terminal
Min
Max
1D
OC
9
tPHZ
3003
139
"
5.0 V
GND
1/
OUT
5.0 V
2
10
"
OC to 1Q
Tc = 25C
Fig. 4
"
140
"
5.0 V
"
"
OUT
"
"
"
"
OC to 2Q
"
141
"
5.0 V
"
"
OUT
"
"
"
"
OC to 3Q
"
142
"
5.0 V
"
"
OUT
"
"
"
"
OC to 4Q
"
143
"
5.0 V
"
"
OUT
"
"
"
"
OC to 5Q
"
144
"
5.0 V
"
"
OUT
"
"
"
"
OC to 6Q
"
145
"
5.0 V
"
"
OUT
"
"
"
"
OC to 7Q
"
146
"
5.0 V
"
"
OUT
"
"
"
"
OC to 8Q
10
fMAX
30
MHz
Tc = 25C
tPLH2
4
18
ns
"
tPHL2
"
17
Same tests and terminal conditions as for subgroup 7, except TC = +125C.
"
tPZL
"
21
"
tPZH
"
"
"
tPLZ
2
18
"
2
12
tPHZ
Same tests, terminal conditions, and limits as for subgroup 10, except TC = -55C.
11
See footnotes at end of device types 04.
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