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Page Title:
Table 3. Group A inspection for device type 05-cont. |
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|  TABLE III. Group A inspection for device type 05.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.8 V; or open).
Symbol MIL-STD- Cases
Subgroup
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
Measured
Limits
Unit
2, R, S
883
method Test no.
2D
3D
4D
5D
6D
7D
8D
GND
CLK
terminal
Min
Max
1D
VCC
8Q
OC
7Q
6Q
5Q
4Q
3Q
2Q
1Q
10
fMAX
30
MHz
Tc = 25C
tPHL2
4
15
ns
"
tPLH2
"
"
Same tests and terminal conditions as for subgroup 7, except TC = +125C.
"
tPZL
"
21
"
tPZH
"
"
"
tPLZ
2
10
"
3
15
tPHZ
Same tests, terminal conditions, and limits as for subgroup 10, except TC = -55C.
11
3.0 V 5.5 V
1/
Apply
0.0 V pulse prior to test.
2/
Method 3011 shall be used, except the output voltage shall be as specified herein, and the output
current shall be operating rather than short circuit current. The output conditions have been chosen
to produce a current that closely approximates one half of the true short circuit output current Ios.
3/
Tests shall be performed in sequence, attributes data only.
Output voltages shall be either: (1) H ≥ 2.4 V minimum and L ≤ 0.4 V maximum when using a high-speed
4/
checker double comparator; (2) H ≥ 1.5 V and L ≤ 1.5 V when using high-speed checker single comparator.
5/
fMAX limit is the frequency of the input pulse. The output frequency shall be one-half the input frequency.
6/
IIL limits shall be as follows:
Min/Max limits in (A) for circuit
Test
A
B
C
IIL3
0/-200
0/-200
0/-200
7/
A = 3.0 V minimum; B = 0.0 V or GND.
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