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| ![]() MIL-M-38510/372B
TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions
Device
Limits
Unit
-55C ≤ TC ≤ +125C
type
Min
Max
unless otherwise specified
VCC = 5.0 V, CL = 50 pF 10%,
Propagation delay time,
tPLH1
01
3
18
ns
RL = R1 = 500 Ω
low-to-high, CLK to Q
02
3
17
04
4
20
Propagation delay time,
tPHL1
01
5
20
ns
high-to-low, CLK to Q
02
5
26
04
5
18
Propagation delay time,
tPLH2
03
2
14
ns
low-to-high, D to Q
Propagation delay time,
tPHL2
03
4
19
ns
high-to-low, D to Q
Propagation delay time,
tPLH3
03
6
21
ns
low-to-high, ENC to Q
Propagation delay time,
tPHL3
03
7
21
ns
high-to-low, ENC to Q
Propagation delay time,
tPLH4
02
5
20
ns
low-to-high, Clear to Q
Propagation delay time,
tPHL4
01, 02
8
26
ns
high-to-low, Clear to Q
Propagation delay time,
tPZH
03
5
26
ns
disable to high level
04
3
22
Propagation delay time,
tPZL
03
6
22
ns
disable to low level
04
5
20
Propagation delay time,
tPHZ
03
2
12
ns
high level to disable
04
1
12
Propagation delay time,
tPLZ
03
2
18
ns
low level to disable
04
2
24
1/ The output conditions have been chosen to produce a current that closely approximates one half of the true
short-circuit output current, IOS.
2/ ICC is measured with D inputs and CLR grounded.
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