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TABLE III. Group A inspection for device type 02 - Continued.
Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open).
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
MIL-STD-
E, F
Subgroup Symbol
883
Case
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Measured
Limits
Unit
method
2 1/
terminal
Test no.
1Q
1D
2D
2Q
GND
CLK
3Q
3D
4D
4Q
VCC
Min
Max
CLR
1Q
2Q
3Q
4Q
9
tPHL1
3003
83
3.0 V
OUT
IN
GND
IN
5.0 V
CLK to 1Q
5
20
ns
Tc = 25C
(fig. 4)
84
"
IN
OUT
"
"
"
CLK to 2Q
"
"
"
"
85
"
"
"
OUT
IN
"
CLK to 3Q
"
"
"
"
86
"
"
"
IN
OUT
"
CLK to 4Q
"
"
"
"
87
"
OUT
IN
"
"
"
"
"
"
CLK to 1 Q
"
88
"
IN
OUT
"
"
"
"
"
"
CLK to 2 Q
"
89
"
"
"
OUT
IN
"
"
"
"
CLK to 3 Q
"
90
"
"
"
IN
OUT
"
"
"
"
CLK to 4 Q
tPLH4
"
91
IN
OUT
3.0 V
"
2/
"
5
18
"
CLR to 1 Q
"
92
"
3.0 V
OUT
"
"
"
"
"
"
CLR to 2 Q
"
93
"
"
"
OUT
3.0 V
"
"
"
"
CLR to 3 Q
"
94
"
"
"
3.0 V
OUT
"
"
"
"
CLR to 4 Q
tPHL4
"
95
"
OUT
3.0 V
"
"
"
CLR to 1Q
8
23
"
"
96
"
3.0 V
OUT
"
"
"
CLR to 2Q
"
"
"
"
97
"
"
"
OUT
3.0 V
"
CLR to 3Q
"
"
"
"
98
"
"
"
3.0 V
OUT
"
CLR to 4Q
"
"
"
10
fMAX
40
MHz
tPLH1  Same tests and terminal conditions as for subgroup 9, except TC = +125C.
3
17
ns
tPHL1
5
26
"
tPLH4
5
20
"
tPHL4
8
26
"
Same tests, terminal conditions and limits as for subgroup 10, except TC = -55C.
11
1/ Terminals not referenced are N/C.
2/ Apply
2.0 V min/4.5 V max
(pulse, prior to test).
-- 0 V
3/ IIL limits shall be as follows:
Min/Max limits in A for circuit
Parameters
A
B
C
IIL
D-inputs
0/-100
CLK/CLR
0/-150
4/ Method 3011 of MIL-STD-883 shall be used, except the output shall be as specified herein, and the output current shall be operating rather than short circuit current.
The output conditions have been chosen to produce a current that closely approximates one half of the true short circuit output current, IOS.
5/ Tests shall be performed in sequence, attributes data only.
6/ A = 2.4 V minimum, B = 0.4 V.
7/ H > 1.5 V, L < 1.5 V.
8/ fMAX minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.

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