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Page Title:
Table 3. Group A inspection for device type 01-cont. |
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|  TABLE III. Group A inspection for device type 01.
Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open).
MIL-STD- Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
Subgroup Symbol
883
R, S, 2
Measured
Test limits
Unit
method Test no.
1D
2D
3D
4D
5D
6D
7D
8D
GND
ENC
8Q
7Q
6Q
5Q
4Q
3Q
2Q
1Q
VCC
terminal
Min
Max
OC
9
tPLZ
3003
149
IN
GND
GND
IN
OUT
5.0 V
2
15
ns
OC to 1Q
Tc = 25
Fig. 4
150
"
GND
"
"
OUT
"
"
"
"
C
OC to 2Q
"
151
"
GND
"
"
OUT
"
"
"
"
OC to 3Q
"
152
"
GND
"
"
OUT
"
"
"
"
OC to 4Q
"
153
"
GND
"
"
OUT
"
"
"
"
OC to 5Q
"
154
"
GND
"
"
OUT
"
"
"
"
OC to 6Q
"
155
"
GND
"
"
OUT
"
"
"
"
OC to 7Q
"
156
"
GND
"
"
OUT
"
"
"
"
OC to 8Q
10
tPLH2
8
27
"
tPHL2
4
20
"
tPLH3
2
15
"
Same tests, terminal conditions as for subgroup 9, except TC = +125 .
tPHL3
2
15
"
C
tPZH
4
21
"
tPZL
4
21
"
tPHZ
2
12
"
tPLZ
2
18
"
Same tests, terminal conditions, and limits as for subgroup 10, except Tc = -55 .
11
C
1/ IIL limits shall be as follows:
Min/Max limits in for circuit
Test
A
A
B
C
IIL
0/-200
0/-100
0/-200
2/ Method 3011 shall be used, except the output voltage shall be as specified herein, and the output current shall be operating rather than short circuit current. The output
conditions have been chosen to produce a current that closely approximates one-half of the true short circuit output current IOS.
3/ IO limits shall be as follows:
Min/Max limits in for circuit
Test
A
A
B
C
IO
-20/-112
-15/-110
-70/-110
4/ Tests shall be performed in sequence, attributes data only.
5/ Outputs shall be high 1.5 V; low 1.5 V.
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