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Page Title:
Table 3. Group A inspection for device type 01-cont. |
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|  TABLE III. Group A inspection for device type 01.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.8 V; or open).
MIL-STD- Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
Measured
Test limits
Unit
Subgroup Symbol
883
R,S,X,2
1A1
2Y4
1A2
2Y3
1A3
2Y2
1A4
2Y1
GND
2A1
1Y4
2A2
1Y3
2A3
1Y2
2A4
1Y1
VCC
method Test no.
terminal
Min
Max
1G
2G
9
tPHZ
3003
142
IN
GND
GND
OUT
5.0 V
2
10
ns
1G
1Y1
Tc = 25C
see fig. 3
143
"
GND
"
OUT
"
"
"
"
1G
1Y2
"
144
"
GND
"
OUT
"
"
"
"
1G
1Y3
"
145
"
GND
"
OUT
"
"
"
"
1G
1Y4
"
"
"
"
146
OUT
"
GND
IN
"
2G
2Y1
"
147
OUT
"
GND
"
"
"
"
"
2G
2Y2
"
148
OUT
"
GND
"
"
"
"
"
2G
2Y3
"
"
"
"
149
OUT
"
GND
"
"
2G
2Y4
10
tPLH1
3
12
"
tPHL1
2
11
"
Same tests and terminal conditions as for subgroup 9, except TC = +125 C and limits are as shown.
tPZL
5
20
"
tPZH
5
15
"
tPLZ
3
18
"
tPHZ
2
12
"
Same tests, terminal conditions and limits as for subgroup 10, except TC = -55C.
11
1/ IIL limits shall be as follows:
Min/Max limits in A for circuit
Test
A
B
C
IIL
0/-100
0/-100
0/-100
2/ Method 3011 shall be used, except the output voltage shall be as specified herein, and the output current shall be operating rather than short circuit current. The output
conditions have been chosen to produce a current that closely approximates one-half of the true short circuit output current IOS.
3/ IO limits shall be -20 mA min/-112 mA max for circuit A and -30 mA min/-110 mA max for circuit C.
4/ A ≥ 2.0 V and B ≤ 0.8 V.
5/ Output voltages shall be either:
a. H = 2.4 V minimum and L = 0.4 V maximum when using a high speed checker double comparator, or
b. H ≥ 1.5 V and L ≤ 1.5 V when using a high speed checker single comparator.
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