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Page Title:
Table 2. Electrical test requirements. |
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|  MIL-M-38510/505C
TABLE I. Electrical performance characteristics Continued.
Parameter
Symbol
Test condition 1/
Limits
Device
Unit
-55 ≤ TC ≤ +125
type
Min
Max
4.5 V ≤ VCC ≤ 5.5 V
Clock to output
tPCH
See figure 4 5/
02,03
20
ns
tPCL
CL = 45 pF minimum
04
Minimum clock pulse width
tP(CL)
02,03
20
ns
04
Minimum setup time
tSU
02,03
30
ns
04
Minimum hold time
tH
All
0
ns
02,03
20
MHz
Maximum clock frequency
fMAX
04
1/ All voltages referenced to ground.
2/ I/O terminal leakage is the worst case of IIX or IOZX.
3/ Only one output shorted at a time. Equivalent I0 test may be performed V0 = 2.25 V, -15 mA
minimum to -125 mA maximum.
4/ Applies to nonregistered outputs only, with internal output enables.
5/ Applies to registered outputs only, with external output enables (pin 13).
TABLE II. Electrical test requirements.
1/ 2/ 3/ 4/
MIL-PRF-38535 test
Subgroups (per table III)
requirements
Class S
Class B
devices
devices
Interim electrical parameters
1
1
(pre burn-in)
Final electrical test parameters
1*, 2, 3, 7*, 8
1*, 2, 3, 7*
for unprogrammed
devices
Final electrical test parameters
1*, 2, 3, 7*, 8, 9, 10, 11
1*, 2, 3, 7*, 8, 9
for programmed
devices
Group A test requirements
1, 2, 3, 7, 8, 9, 10, 11
1, 2, 3, 7, 8, 9, 10, 11
Group B electrical test parameters
1, 2, 3, 7, 8, 9, 10, 11
N/A
when using the method 5005 QCI
option.
Group C end-point electrical
1, 2, 3, 7, 8, 9, 10, 11
1, 2, 3, 7, 8
parameters
Group D end-point electrical
1, 2, 3, 7, 8
1, 2, 3, 7, 8
parameters
1/
(*) indicates PDA applies to subgroups 1 and 7.
2/
Any or all subgroups may be combined when using high-speed testers.
3/
Subgroup 7 and 8 shall consist of verifying the pattern specified.
4/
Subgroup 8 requirements are for programmed devices only.
5
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