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Page Title:
Table 3A. Test conditions for all devices, group A inspection |
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|  MIL-M-38510/60B
c. Additional screening for space level product shall be as specified in MIL-PRF-38535.
4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535.
4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance
with MIL-PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).
4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as
follows:
a. Tests shall be as specified in table II herein.
b. Subgroups 4, 5, 6, 7, and 8 shall be omitted.
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II MIL-PRF-38535.
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as
follows:
a. End-point electrical parameters shall be as specified in table II herein.
b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall
be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in
test circuit shall be maintained under document control by the device manufacturer's Technology
Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring
or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power
dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883.
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End-
point electrical parameters shall be as specified in table II herein.
4.5 Methods of inspection. Methods of inspection shall be as specified and as follows:
4.5.1 Voltage and current. All voltages given are referenced to the microcircuit ground terminal. Currents
given are conventional and positive when flowing into the referenced terminal.
TABLE IIIA. Test conditions for all devices, group A inspection
VITL
VIL1
VIH2
VIL2
VITH
E1
E2
E3
LD1
LD2
Symbol
VIH1
IN
(V)
(V)
(V)
(V)
(V)
(V)
(V)
(V)
(V)
OUT
TC = 25C
100Ω to
100Ω to
-0.780
-1.850
+1.11
+0.31
-1.475
-1.105
-5.2
-3.2
+2.0
See
Fig 3
-2 V
GND
TC = 125C
100Ω to
100Ω to
-0.630
-1.820
+1.24
+0.36
-1.400
-1.000
-5.2
-3.2
+2.0
See
Fig 3
-2 V
GND
TC = -55C
100Ω to
100Ω to
-0.880
-1.920
+1.01
+0.28
-1.510
-1.255
-5.2
-3.2
+2.0
See
Fig 3
-2 V
GND
7
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