Microcircuits, Digital, High Speed, CMOS, Nor Gates, Monolithic Silicon, Positive Logic

• Microcircuits, Digital, High Speed, CMOS, Nor Gates, Monolithic Silicon, Positive Logic
• Design, Construction, and physical dimensions
• Sampling and inspection
• Table 1. Electrical performance characteristics
• Table 1. Electrical performance characteristics-cont.
• Table 1. Electrical performance characteristics-cont.
• Table 2. Burn-in and electrical test requirements
• Quality conformance inspection
• Figure 1. Logic diagram and terminal connections (top views)
• Figure 1. Logic diagram and terminal connections (top views) (Device type 04)
• Figure 2. Truth tables and logic equations
• Figure 3. Burn-in and life test circuits
• Figure 4. Switching time test circuit and waveforms
• Table 3. Group A inspection for device type 01
• Table 3. Group A inspection for device type 01-cont.
• Table 3. Group A inspection for device type 01-cont.
• Table 3. Group A inspection for device type 02
• Table 3. Group A inspection for device type 02-cont.
• Table 3. Group A inspection for device type 02-cont.
• Table 3. Group A inspection for device type 03
• Table 3. Group A inspection for device type 03-cont.
• Table 3. Group A inspection for device type 03-cont.
• Table 3. Group A inspection for device type 04
• Table 3. Group A inspection for device type 04-cont.
• Table 3. Group A inspection for device type 05
• Table 3. Group A inspection for device type 05-cont.
• Table 3. Group A inspection for device type 05-cont.
• Group C inspection
• Data reporting
• Substitutability
• Instructions
• Standardization Document Improvement Proposal
• Custodians
• Blank Page

Microcircuits, Digital, High Speed, CMOS, Nor Gates, Monolithic Silicon, Positive Logic

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