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Page Title:
Table 3. Group A inspection for device type 03-cont. |
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|  TABLE III. Group A inspection for device type 03 - Continued.
Terminal conditions (pins not designated may be high > 2.0 V, low < 0.8 V, or open)
Cases X,2 1/
2
3
4
6
8
9
10
12
13
14
16
18
19
20
Cases A,
MIL-
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Test limits
Subgroup
B, C, D
Symbol
STD-883
Measured
Unit
method
Min
Max
terminal
Test no.
1A
1Y
2A
2Y
3A
3Y
GND
4Y
4A
5Y
5A
6Y
6A
VCC
10
3003
63
IN
OUT
2.7 V
2.7 V
GND
2.7 V
2.7 V
2.7 V
5.0 V
1A to 1Y
2.0
9.0
ns
tPHL
Fig. 3
64
2.7 V
IN
OUT
2.7 V
"
"
"
"
"
2A to 2Y
"
"
"
TC = 125C
"
65
"
2.7 V
IN
OUT
"
"
"
"
"
3A to 3Y
"
"
"
"
66
"
"
2.7 V
"
OUT
IN
"
"
"
4A to 4Y
"
"
"
"
67
"
"
"
"
2.7 V
OUT
IN
"
"
5A to 5Y
"
"
"
"
68
"
"
"
"
"
2.7 V
OUT
IN
"
6A to 6Y
"
"
"
"
69
IN
OUT
"
"
"
"
"
2.7 V
"
1A to 1Y
"
"
"
tPLH
"
70
2.7 V
IN
OUT
"
"
"
"
"
"
2A to 2Y
"
"
"
"
71
"
2.7 V
IN
OUT
"
"
"
"
"
3A to 3Y
"
"
"
"
72
"
"
2.7 V
"
OUT
IN
"
"
"
4A to 4Y
"
"
"
"
73
"
"
"
"
2.7 V
OUT
IN
"
"
5A to 5Y
"
"
"
"
74
"
"
"
"
2.7 V
2.7 V
OUT
IN
"
6A to 6Y
"
"
"
11
Same tests, terminal conditions, and limits as for subgroup 10, except TC = -55C.
1/ Case X and 2 terminals not designated are NC.
2/ For circuit C, IOS maximum test limits = -110 mA.
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