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| TABLE III. Group A inspection for device type 09 - Continued.
Terminal conditions (pins not designated may be high > 2.0 V, low < 0.8 V, or open)
Cases
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
X, 2 1/
MIL-
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Test limits
Subgroup Symbol STD-883 E, F
Measured
Unit
method
Min
Max
terminal
Test no.
A
B
C
D
E
F
G
GND
Y
H
I
J
K
L
M
VCC
tPHL
3003
97
IN
2.7 V
2.7 V
2.7 V
2.7 V
2.7 V
2.7 V
GND
OUT
2.7 V
2.7 V
2.7 V
2.7 V
2.7 V
2.7 V
5.0 V
A to Y
2.0
12.0
ns
10
Fig. 3
98
2.7 V
IN
2.7 V
"
"
"
"
"
"
"
"
"
"
"
"
"
B to Y
"
"
"
TC = 125C
"
99
"
2.7 V
IN
"
"
"
"
"
"
"
"
"
"
"
"
"
C to Y
"
"
"
"
100
"
"
2.7 V
IN
"
"
"
"
"
"
"
"
"
"
"
"
D to Y
"
"
"
"
101
"
"
"
2.7 V
IN
"
"
"
"
"
"
"
"
"
"
"
E to Y
"
"
"
"
102
"
"
"
"
2.7 V
IN
"
"
"
"
"
"
"
"
"
"
F to Y
"
"
"
"
103
"
"
"
"
"
2.7 V
IN
"
"
"
"
"
"
"
"
"
G to Y
"
"
"
"
104
"
"
"
"
"
"
2.7 V
"
"
IN
"
"
"
"
"
"
H to Y
"
"
"
"
105
"
"
"
"
"
"
"
"
"
2.7 V
IN
"
"
"
"
"
I to Y
"
"
"
"
"
106
"
"
"
"
"
"
"
"
"
"
2.7 V
IN
"
"
"
"
J to Y
"
"
"
107
"
"
"
"
"
"
"
"
"
"
"
2.7 V
IN
"
"
"
K to Y
"
"
"
"
108
"
"
"
"
"
"
"
"
"
"
"
"
2.7 V
IN
"
"
L to Y
"
"
"
"
109
"
"
"
"
"
"
"
"
"
"
"
"
"
2.7 V
IN
"
M to Y
"
"
"
"
110
IN
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
A to Y
"
9.0
"
tPLH
"
111
2.7 V
IN
"
"
"
"
"
"
"
"
"
"
"
"
"
"
B to Y
"
"
"
"
112
"
2.7 V
IN
"
"
"
"
"
"
"
"
"
"
"
"
"
C to Y
"
"
"
"
113
"
"
2.7 V
IN
"
"
"
"
"
"
"
"
"
"
"
"
D to Y
"
"
"
"
114
"
"
"
2.7 V
IN
"
"
"
"
"
"
"
"
"
"
"
E to Y
"
"
"
"
115
"
"
"
"
2.7 V
IN
"
"
"
"
"
"
"
"
"
"
F to Y
"
"
"
"
116
"
"
"
"
"
2.7 V
IN
"
"
"
"
"
"
"
"
"
G to Y
"
"
"
"
117
"
"
"
"
"
"
2.7 V
"
"
IN
"
"
"
"
"
"
H to Y
"
"
"
"
118
"
"
"
"
"
"
"
"
"
2.7 V
IN
"
"
"
"
"
I to Y
"
"
"
"
119
"
"
"
"
"
"
"
"
"
"
2.7 V
IN
"
"
"
"
J to Y
"
"
"
"
120
"
"
"
"
"
"
"
"
"
"
"
2.7 V
IN
"
"
"
K to Y
"
"
"
"
121
"
"
"
"
"
"
"
"
"
"
"
"
2.7 V
IN
"
"
L to Y
"
"
"
"
122
"
"
"
"
"
"
"
"
"
"
"
"
2.7 V
2.7 V
IN
"
M to Y
"
"
"
11
Same tests, terminal conditions, and limits as for subgroup 10, except TC = -55C.
1/ Case X and 2 terminals not designated are NC.
2/ For circuit C, IOS maximum test limits = -110 mA.
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