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Page Title:
Table 3. Group A inspection for device type 02-cont. |
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|  TABLE III. Group A inspection for device type 02 - Continued.
Terminal conditions (pins not designated may be high > 2.0 V, low < 0.8 V, or open).
Case X,2
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
1/
MIL-
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Test limits
Unit
Subgroup
Symbol STD-883 E,F
Measured
method Test no. CLK 1
Min Max
terminal
GND
Q2
PRE 2
J2
K2
CLK 2 CLR 2 CLR 1
K1
J1
PRE 1
Q1
Q1
Q2
VCC
9
9/
Fig. 8
124
IN (A)
2.7 V
IN (F)
E
OUT
GND
2.7 V
5.0 V
Q1
tHOLD
(L)
"
125
"
OUT
E
IN (F)
2.7 V
IN (A)
2.7 V
"
Q2
"
TC = +25C
"
126
IN (A)
IN (F)
2.7 V
2.7 V
OUT
"
E
"
"
Q1
"
127
OUT
"
2.7 V
2.7 V
IN (F)
IN (A)
E
"
"
Q2
"
128
IN (A)
2.7 V
IN (G)
2.7 V
OUT
"
E
"
Q1
"
tHOLD
(H)
"
129
"
OUT
2.7 V
IN (G)
2.7 V
IN (A)
E
"
Q2
"
"
130
IN (A)
IN (G)
2.7 V
E
OUT
"
2.7 V
"
"
Q1
"
131
OUT
"
E
2.7 V
IN (G)
IN (A)
2.7 V
"
"
Q2
10
Fig. 7
132-135
60
MHz
fMAX
8/
TC = +125C
Fig. 6
136-139
2.0 11.0
ns
tPLH1
Fig. 7
140-143
"
"
"
tPLH2
144-149 Same tests and terminal conditions as for subgroup 9, except TC = +125C and limits are as shown.
Fig. 6
"
"
"
tPHL3
Fig. 7
148-151
"
"
"
tPHL2
Fig. 8
152-155
9/
tSETUP
(L)
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