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| ![]() TABLE III. Group A inspection for device type 03.
Terminal conditions (pins not designated may be high > 2.0 V, low < 0.8 V, or open).
Cases X,2 1/
2
3
4
6
8
9
10
12
13
14
16
18
19
20
MIL-
Cases A,
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Test limits
Symbol
STD-883
Subgroup
B,C,D
Measured
Unit
method
Min
Max
terminal
Test no.
CLK 1
K1
J1
PRE 1
Q1
GND
Q2
PRE 2
J2
K2
CLK 2
Q1
Q2
VCC
1
3005
1
C 2/
0.8 V
2.0 V
2.0 V
-1 mA
GND
4.5 V
2.5
V
Q1
VOH
"
2
"
-1 mA
2.0 V
2.0 V
0.8 V
C
"
Q2
"
"
TC = +25C
"
"
"
3
C
2.0 V
0.8 V
2.0 V
-1 mA
"
"
Q1
"
"
"
4
"
-1 mA
2.0 V
0.8 V
2.0 V
C
"
Q2
"
5
0.8 V
-1 mA
"
"
"
"
Q1
"
6
"
-1 mA
0.8 V
"
Q2
"
"
3007
7
C
0.8 V
2.0 V
2.0 V
20 mA
"
"
0.5
"
Q1
VOL
"
"
"
8
"
20 mA
2.0 V
2.0 V
0.8 V
C
"
Q2
"
9
C
2.0 V
0.8 V
2.0 V
20 mA
"
"
"
"
Q1
"
10
"
20 mA
2.0 V
0.8 V
2.0 V
C
"
Q2
"
"
"
"
"
11
0.8 V
20 mA
"
"
Q1
"
"
"
12
"
20 mA
0.8 V
"
Q2
13
-18 mA
"
"
-1.2
"
CLK 1
VIC
14
-18 mA
"
"
K1
"
"
15
-18 mA
"
"
"
"
J1
16
-18 mA
"
"
PRE 1
"
"
17
"
-18 mA
"
PRE 2
"
"
18
"
-18 mA
"
J2
"
"
19
"
-18 mA
"
K2
"
"
20
"
-18 mA
"
CLK 2
"
"
3009
21
5.5 V
0.5 V
GND
D
"
5.5 V
K1
-.7
-1.6
mA
IIL1
"
22
"
D
GND
0.5 V
5.5 V
"
K2
"
"
"
"
23
D
5.5 V
0.5 V
5.5 V
"
"
J1
"
"
"
"
24
"
5.5 V
0.5 V
5.5 V
D
"
J2
"
"
"
"
25
5.5 V
5.5 V
5.5 V
0.5 V
"
"
PRE 1
-0.8
-6.0
"
IIL3
"
26
"
0.5 V
5.5 V
5.5 V
5.5 V
"
PRE 2
-0.8
-6.0
"
IIL3
"
27
0.5 V
5.5 V
5.5 V
D
"
"
CLK 1
-2.0 3/
-4.0
"
IIL4
"
28
"
D
5.5 V
5.5 V
0.5 V
"
CLK 2
-2.0 3/
-4.0
"
IIL4
3010
29
GND
2.7 V
GND
GND
"
"
K1
50
A
IIH1
"
30
"
GND
GND
2.7 V
GND
"
K2
"
"
"
31
C
GND
2.7 V
5.5 V
"
"
J1
"
"
"
32
"
5.5 V
2.7 V
GND
C
"
J2
"
"
See footnotes at end of device type 03.
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