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Page Title:
Table 3. Group A inspection for device type 03-cont. |
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|  TABLE III. Group A inspection for device type 03 - Continued.
Terminal conditions (pins not designated may be high > 2.0 V, low < 0.8 V, or open).
Cases X,2 1/
2
3
4
6
8
9
10
12
13
14
16
18
19
20
MIL-
Cases A,
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Test limits
Subgroup
Symbol
STD-883
B,C,D
Measured
Unit
method
Min
Max
terminal
Test no.
CLK 1
K1
J1
PRE 1
Q1
GND
Q2
PRE 2
J2
K2
CLK 2
Q1
Q2
VCC
5.0 V CLK 1 to Q1
Fig. 10
92
IN (B)
2.7 V
2.7 V
E
OUT
GND
9
2.0
9.0
ns
tPLH3
CLK 2 to Q2
Fig. 10
93
"
OUT
E
2.7 V
2.7 V
IN (B)
"
"
"
"
TC = +25C
tPLH3
PRE 1 to Q1
Fig. 9
94
IN (C)
2.7 V
GND
IN (D)
OUT
"
"
"
"
"
tPHL1
PRE 2 to Q2
Fig. 9
95
"
OUT
IN (D)
GND
2.7 V
IN (C)
"
"
"
"
tPHL1
CLK 1 to Q1
Fig. 10
96
IN (B)
2.7 V
2.7 V
E
OUT
"
"
"
"
"
tPHL2
CLK 2 to Q2
"
97
"
OUT
E
2.7 V
2.7 V
IN (B)
"
"
"
"
tPHL2
"
98
IN (B)
2.7 V
2.7 V
E
OUT
"
"
CLK 1 to Q1
"
"
"
tPHL3
"
99
"
OUT
E
2.7 V
2.7 V
IN (B)
"
"
"
"
CLK 2 to Q2
tPHL3
Fig. 11
100
IN (E)
2.7 V
IN (F)
E
OUT
"
"
9/
Q1
tSET
(H)
"
101
"
OUT
E
IN (F)
2.7 V
IN (E)
"
Q2
"
"
102
IN (E)
IN (F)
2.7 V
2.7 V
OUT
"
"
"
Q1
"
103
"
OUT
2.7 V
2.7 V
IN (F)
IN (E)
"
Q2
"
"
104
IN (E)
2.7 V
IN (G)
E
OUT
"
"
"
Q1
tSET
(L)
"
105
"
OUT
E
IN (G)
2.7 V
IN (E)
"
Q2
"
"
106
IN (E)
IN (H)
2.7 V
E
OUT
"
"
"
Q1
"
107
"
OUT
2.7 V
2.7 V
IN (H)
IN (E)
"
Q2
"
Fig. 12
108
IN (E)
2.7 V
IN (J)
E
OUT
"
"
"
Q1
tHOLD
(H)
"
109
"
OUT
E
IN (J)
2.7 V
IN (E)
"
Q2
"
"
110
IN (E)
IN (K)
2.7 V
E
OUT
"
"
"
Q1
"
111
"
OUT
E
2.7 V
IN (K)
IN (E)
"
Q2
"
"
112
IN (E)
2.7 V
IN (L)
E
OUT
"
"
"
Q1
tHOLD
(L)
"
113
"
OUT
E
IN (L)
2.7 V
IN (E)
"
Q2
"
"
114
IN (E)
IN (L)
2.7 V
2.7 V
OUT
"
"
"
Q1
"
115
"
OUT
2.7 V
2.7 V
IN (L)
IN (E)
"
Q2
"
See footnotes at end of device type 03.
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