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Page Title:
Table 3. Group A inspection for device type 04 |
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|  TABLE III. Group A inspection for device type 04.
Terminal conditions (pins not designated may be high > 2.0 V, low < 0.8 V, or open).
MIL-
Cases A,
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Test limits
Subgroup
Symbol
STD-883
B,C,D
Measured
Unit
method
Min
Max
terminal
Test no.
CLR
K1
J1
PRE 1
Q1
GND
Q2
PRE 2
J2
K2
CLK
Q1
Q2
VCC
1
3006
1
2.0 V
0.8 V
2.0 V
2.0 V
-1 mA
GND
C 1/
4.5 V
2.5
V
Q1
VOH
"
2
"
"
-1 mA
2.0 V
2.0 V
0.8 V
"
"
Q2
"
"
TC = +25C
"
"
"
3
"
2.0 V
0.8 V
2.0 V
-1 mA
"
"
"
Q1
"
"
"
4
"
"
-1 mA
2.0 V
0.8 V
2.0 V
"
"
Q2
"
5
"
0.8 V
-1 mA
"
5.5 V
"
"
"
Q1
"
6
"
"
-1 mA
0.8 V
"
"
Q2
"
"
"
"
"
7
0.8 V
2.0 V
-1 mA
"
"
"
Q1
"
"
"
8
0.8 V
"
-1 mA
2.0 V
"
"
Q2
3007
9
2.0 V
0.8 V
2.0 V
2.0 V
20 mA
"
C
"
0.5
"
Q1
VOL
"
"
"
10
"
"
20 mA
2.0 V
2.0 V
0.8 V
"
"
Q2
"
11
"
2.0 V
0.8 V
2.0 V
20 mA
"
"
"
"
"
Q1
"
12
"
"
20 mA
2.0 V
0.8 V
2.0 V
"
"
Q2
"
"
"
"
"
13
"
0.8 V
20 mA
"
5.5 V
"
Q1
"
"
"
14
"
"
20 mA
0.8 V
"
"
Q2
"
15
0.8 V
2.0 V
20 mA
"
"
"
"
"
Q1
"
16
0.8 V
"
20 mA
2.0 V
"
"
Q2
"
"
17
-18 mA
"
"
CLR
-1.2
"
VIC
18
-18 mA
"
"
K1
"
"
19
-18 mA
"
"
J1
"
"
20
-18 mA
"
"
PRE 1
"
"
21
"
-18 mA
"
PRE 2
"
"
22
"
-18 mA
"
J2
"
"
23
"
-18 mA
"
K2
"
"
24
"
-18 mA
"
CLK
"
"
3009
25
5.5 V
0.5 V
GND
D
"
5.5 V
5.5 V
K1
-0.7
-1.6
mA
IIL1
"
26
5.5 V
"
D
GND
0.5 V
"
"
K2
"
"
"
"
27
D
GND
0.5 V
5.5 V
"
"
"
J1
"
"
"
"
28
D
"
5.5 V
0.5 V
5.5 V
"
"
J2
"
"
"
"
29
5.5 V
5.5 V
5.5 V
0.5 V
"
"
"
PRE 1
-0.8
-6.0
"
IIL3
"
30
5.5 V
"
0.5 V
5.5 V
5.5 V
"
"
PRE 2
-0.8
-6.0
"
"
31
0.5 V
5.5 V
5.5 V
5.5 V
"
5.5 V
"
"
"
"
CLR
-1.6
-12.0
"
IIL2
"
32
D
5.5 V
5.5 V
5.5 V
"
5.5 V
"
"
0.5 V
"
CLK
-4.4
-8.0
"
IIL4
See footnotes at end of device type 04.
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