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Page Title:
Table 3. Group A inspection for device type 06-cont. |
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|  TABLE III. Group A inspection for device type 06 - Continued.
Terminal conditions (pins not designated may be high > 2.0 V, low < 0.8 V, or open).
MIL-
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Test limits
Subgroup Symbol STD-883 E, F
Measured
Unit
method Test no.
Min
Max
terminal
CLR
Q1
D1
D2
Q2
GND
CLK
Q3
D3
D4
Q4
Q1
Q2
Q3
Q4
VCC
7 3/ 4/
66
B
L
H
A
A
H
L
GND
B
L
H
A
A
H
L
4.5 V
H or L 5/
V
All
67
"
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
as shown
"
outputs
TC = +25C
68
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
"
"
69
A
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
"
"
70
"
H
L
"
"
L
H
"
A
H
L
"
"
L
H
"
"
"
"
71
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
"
"
72
"
"
"
B
B
"
"
"
B
"
"
B
B
"
"
"
"
"
"
3
"
L
H
"
"
H
L
"
A
L
H
"
"
H
L
"
"
"
"
74
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
"
"
75
"
"
"
A
A
"
"
"
B
"
"
A
A
"
"
"
"
"
"
76
"
H
L
"
"
L
H
"
A
H
L
"
"
L
H
"
"
"
"
77
"
H
L
"
"
L
H
"
B
H
L
"
"
L
H
"
"
"
"
78
B
L
H
"
"
H
L
"
B
L
H
"
"
H
L
"
"
"
"
8 3/ 4/
Same tests, terminal conditions and limits as for subgroup 7, except TC = +125C and -55C.
Fig. 14
79
2.7 V
OUT
IN (B)
GND
IN (A)
5.0 V
75
MHz
9
Q1
fMAX
"
"
6/
"
80
"
OUT
IN (B)
"
"
"
Q1
TC = +25C
"
81
"
IN (B)
OUT
"
"
"
Q2
"
"
"
"
"
82
"
IN (B)
OUT
"
"
"
Q2
"
83
"
"
"
OUT
IN (B)
"
Q3
"
"
"
84
"
"
"
OUT
IN (B)
"
"
"
Q3
"
85
"
"
"
IN (B)
OUT
"
Q4
"
"
"
"
"
86
"
"
"
IN (B)
OUT
"
Q4
Fig. 15
87
"
OUT
IN (E)
"
IN (C)
"
CLK to Q1
2.0
14.0
ns
tPLH1
CLK to Q1
"
88
"
OUT
IN (D)
"
"
"
"
"
"
"
89
"
IN (E)
OUT
"
"
"
CLK to Q2
"
"
"
CLK to Q2
"
90
"
IN (D)
OUT
"
"
"
"
"
"
"
91
"
"
"
OUT
IN (E)
"
CLK to Q3
"
"
"
CLK to Q3
"
92
"
"
"
OUT
IN (D)
"
"
"
"
"
93
"
"
"
IN (E)
OUT
"
CLK to Q4
"
"
"
CLK to Q4
"
94
"
"
"
IN (D)
OUT
"
"
"
"
See footnotes at end of device type 06.
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