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Page Title:
Table 3. Group A inspection for device type 06-cont. |
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|  TABLE III. Group A inspection for device type 06 - Continued.
Terminal conditions (pins not designated may be high > 2.0 V, low < 0.8 V, or open).
MIL-
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Test limits
Symbol STD-883 E, F
Subgroup
Measured
Unit
method Test no.
Min
Max
terminal
Q2
Q3
Q4
CLR
Q1
Q2
GND
CLK
Q3
D3
D4
Q4
D1
D2
Q1
VCC
10
Fig. 15 143-150
2.0
23.0
ns
tPHL1
TC = +125C
Same tests and terminal conditions as for subgroup 9, except TC = +125C and limits are as shown.
Fig. 13 151-154
"
23.0
"
tPHL3
"
29.0
"
Fig. 13 155-158
tPHL2
11
Same tests, terminal conditions, and limits as for subgroup 10, except TC = -55C.
1/ C = Normal clock pulse.
D = Momentary connection: 5.0 V to momentary GND to 5.0 V occurs before measurement is made.
2/ For circuit B, IOS(max) is -110 mA.
3/ Only a summary of attributes data is required.
4/ Inputs: A = 2.4 V minimum, B = 0.4 V.
5/ Outputs: H ≥ 1.5 V, L ≤ 1.5 V.
6/ fMAX, minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.
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