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| ![]() MIL-M-38510/753B
TABLE I. Electrical performance characteristics - Continued.
Test and
Device
Unit
Test Conditions 1/
Group A
Limits 1/
VCC
Symbol
-55C ≤ TC ≤ +125C
MIL-STD-883
type 2/
subgroups
+3.0 V ≤ VCC ≤ +5.5 V
test method
Min
Max
unless otherwise specified
A
Quiescent supply
For all inputs,
01-05
1.0
1
ICCH
5.5 V
4/ 5/
VIN = VCC or GND
current, output
06-08
2.0
high
All
2
40.0
3005
M
15.0
02, 04,
1
07
D
75.0
P, L, R
700.0
700.0
F
02, 07
A
Quiescent supply
For all inputs,
01-05
1.0
1
ICCL
5.5 V
4/ 5/
VIN = VCC or GND
current, output
06-08
2.0
low
All
2
40.0
3005
M
15.0
02, 04,
1
07
D
75.0
P, L, R
700.0
F
02, 07
700.0
High level
VLD = 2.5 V
01-05
1000
4.5 V
4
mV
VGBH
IOH = -24 mA
ground bounce
8/ 9/
06-08
2000
VIN = 4.5 V or 0.0 V
noise
See figure 3
Low level
VLD = 2.5 V
01-05
1000
4.5 V
4
mV
VGBL
IOL = +24 mA
ground bounce
8/ 9/
06-08
2000
VIN = 4.5 V or 0.0 V
noise
See figure 3
tw ≥ 100 s
All
5.5 V
2
200
mA
Latch-up input/
ICC
tcool ≥ tw
output over-
(O/V1)
5 s ≤ tr ≤ 5 ms
voltage
10/
5 s ≤ tf ≤ 5 ms
Vtest = 6.0 V
VCCQ = 5.5 V
Vover = 10.5 V
tw ≥ 100 s
All
5.5 V
2
200
mA
Latch-up input/
ICC
tcool ≥ tw
output positive
(O/I1+)
5 s ≤ tr ≤ 5 ms
over-current
10/
5 s ≤ tf ≤ 5 ms
Vtest = 6.0 V
VCCQ = 5.5 V
Itrigger = +120 mA
tw ≥ 100 s
Latch-up input/
All
5.5 V
2
200
mA
ICC
tcool ≥ tw
output negative
(O/I1-)
5 s ≤ tr ≤ 5 ms
over-current
10/
5 s ≤ tf ≤ 5 ms
Vtest = 6.0 V
VCCQ = 5.5 V
Itrigger = -120 mA
tw ≥ 100 s
All
5.5 V
2
100
mA
Latch-up supply
ICC
tcool ≥ tw
over-voltage
(O/V2)
5 s ≤ tr ≤ 5 ms
10/
5 s ≤ tf ≤ 5 ms
Vtest = 6.0 V
VCCQ = 5.5 V
Vover = 9.0 V
See footnotes at end of table.
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