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| ![]() MIL-M-38510/753B
TABLE I. Electrical performance characteristics - Continued.
Unit
Test and
Test Conditions 1/
VCC
Group A
Limits 1/
Symbol
Device
-55C ≤ TC ≤ +125C
MIL-STD-883
type 2/
subgroups
+3.0 V ≤ VCC ≤ +5.5 V
test method
Min
Max
unless otherwise specified
3.0 V
ns
Propagation
tPHL,
CL = 50 pF minimum
9, 11
1.0
12.0
02, 04
RL = 500Ω
delay time, SD
tPLH
10
1.0
14.0
4/ 5/
or CD to Q or Q
See figure 4
13/ 14/
3003
M
02, 04
9
1.0
12.0
D
02, 04
1.0
12.0
P, L, R
02, 04
1.0
12.0
F
02
1.0
13.0
4.5 V
ns
CL = 50 pF minimum
9, 11
1.0
10.0
02, 04
RL = 500Ω
10
1.0
12.0
See figure 4
M
02, 04
1.0
10.0
9
D
02, 04
1.0
10.0
P, L, R
1.0
10.0
02, 04
F
02
1.0
10.0
3.0 V
ns
tPHL
07, 08
Propagation
CL = 50 pF minimum
9, 11
1.0
11.5
4/ 5/
RL = 500Ω
delay time, MR
10
1.0
13.5
13/ 14/
to Q
See figure 4
3003
M
07
9
1.0
11.5
D
07
1.0
11.5
P, L, R
07
1.0
11.5
F
07
1.0
13.0
4.5 V
ns
CL = 50 pF minimum
9, 11
1.0
9.0
07, 08
RL = 500Ω
10
1.0
11.0
See figure 4
M
07
9
1.0
9.0
D
07
1.0
9.0
P, L, R
07
1.0
9.0
F
07
1.0
10.0
tPLH
3.0 V
ns
CL = 50 pF minimum
Propagation
08
9, 11
1.0
12.5
4/ 5/
RL = 500Ω
delay time, MR
10
1.0
15.0
13/ 14/
to Q
See figure 4
4.5 V
9, 11
1.0
9.0
08
3003
10
1.0
11.0
1/ Each input/output, as applicable, shall be tested at the specified temperature for the specified limits. Output terminals not
designated shall be high level logic, low level logic, or open, except as follows:
a. VIC (pos) tests, the GND terminal can be open. TC = +25C.
b. VIC (neg) tests, the VCC terminal shall be open. TC = +25C.
c. All ICC tests, the output terminal shall be open. When performing these tests, the current meter shall be
placed in the circuit such that all current flows through the meter.
For negative and positive voltage and current values, the sign designates the potential difference in reference to GND and
the direction of current flow respectively and the absolute value of the magnitude, not the sign, is relative to the minimum and
maximum limits, as applicable, listed herein.
2/ The word "All" in the device type column means the value listed in the limit columns apply for all device types listed herein.
Where. M, D, P, L, R, and F in the conditions column specify the postirradiation limits for those device types specified in the
device type column.
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