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MIL-M-38510/762A
3.2 Electrical performance characteristics and post irradiation parameter limits. Unless otherwise specified, the electrical
performance characteristics, and post irradiation parameter limits are as specified in table I. Electrical performance characteristics
apply over the case operating temperature range specified. Test conditions for these specified characteristics and limits are as
specified in table I. A pin-for-pin conditions and testing sequence for table I parameters shall be maintained and available upon
request from the qualifying activity, on qualified devices.
3.3 Lead material and finish. The lead material and finish shall be in accordance with MIL-M-38510 and 6.4 herein.
3.4 Electrical test requirements. The electrical test requirements for each device class shall be the subgroups specified in table
II. The electrical tests for each subgroup are described in table I. Radiation hardness assurance level designators M, D, L, and R
(see MIL-M-38510) in table I are post irradiation end-point electrical parameters.
3.5 Correctness of indexing and marking. All devices shall be subjected to the final electrical tests specified in table II after PIN
marking (in accordance with MIL-M-38510) to verify that they are correctly indexed and identified by PIN (see 6.7). Optionally, an
approved electrical test may be devised especially for this requirement.
3.5.1 Radiation hardness assurance identifier. The radiation hardness assurance identifier shall be in accordance with MIL-M-
38510 and herein (see 3.4).
3.6 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group number 39 (see
MIL-M-38510, appendix E).
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