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Page Title:
Table 3. Group A inspection for device type 07-cont. |
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|  TABLE III. Group A inspection for device type 07 Continued.
Terminal conditions (pins not designated may be H > 2.0 V, or L < 0.8 V, or open)
Cases
Test limits
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
E,F
MIL-
Measured
Unit
Subgroup
Symbol STD-883 X, 2 7/
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Min
Max
terminal
method
Test no.
S
1A
1B
1Y
2A
2B
2Y
GND
3Y
3B
3A
4Y
4B
4A
0E
VCC
tZL
10
3003
136
GND
2.7 V
OUT
GND
IN
5.0 V
2.0
30
ns
1Y
Fig. 10
137
"
2.7 V
OUT
"
"
"
2Y
"
"
"
TC = +125C
"
138
"
"
OUT
2.7 V
"
"
"
"
"
3Y
"
139
"
"
OUT
2.7 V
"
"
4Y
"
"
"
tHZ 6/
"
140
2.7 V
GND
OUT
"
"
"
"
15
"
1Y
"
141
"
GND
OUT
"
"
"
2Y
"
"
"
"
142
"
"
OUT
GND
"
"
"
"
"
3Y
"
143
"
"
OUT
GND
"
"
4Y
"
"
"
tLZ
"
144
GND
2.7 V
OUT
"
"
"
"
22
"
1Y
"
145
"
2.7 V
OUT
"
"
"
2Y
"
"
"
"
146
"
"
OUT
2.7 V
"
"
"
"
"
3Y
"
147
"
"
OUT
2.7 V
"
"
4Y
"
"
"
11
Same tests, terminal conditions, and limits as for subgroup 10, except TC = -55C.
1/ For circuit B, IOS(max) = -110 mA.
2/ A = 2.4 V; B = 0.4 V.
3/ H > 1.5 V; L < 1.5 V.
4/ Only a summary of attributes is required.
5/ tHZ maximum limit for circuit C is 22 ns.
6/ tHZ maximum limit for circuit C is 24 ns.
7/ Case 2 pins not designated are NC.
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