4.4 Quality conformance inspection.
4.4.1 Inspection lot formation. Inspection lots formation
shall be as defined in MIL-M-38510 for Class B devices.
a. Quality conformance inspection requirements shall be in
accordance with Tables I, II, III and specified herein.
Inspection requirements. Inspection requirements for
this device shall be in accordance with the requirements of
MIL-M-38510 and MIL-STD-883B, Method 5005 (Class B).
c. Conformance testing. Groups A, B, C, and D test
procedures shall be in accordance with MIL-STD-883, Method 5005,
Class B. Group A electrical tests shall include all parameters
specified in Tables II and III of Dwg 9355162. Groups C and D end
point parameters shall include all parameters specified in Table
herein. Sampling plan shall be in accordance with applicable
paragraphs of MIL-M-38510, Appendix B.
d. General inspection conditions. Disposition of failed
lots and lot resubmission procedures shall be in accordance with
applicable paragraphs of MIL-M-38510.
4.5 Test methods, circuits and procedures.
4.5.1 Alternate methods, circuits and procedures.
otherwise stated in the specific test method, the methods and
circuits shown are given as the basic measurement method. For
alternate methods, circuits and procedures the manufacturer shall
demonstrate to the procuring activity that alternates which he may
desire and propose to use are equivalent and give results within the
desired accuracy of measurement (See 6.3).
4.5.2 Test conditions. Unless otherwise specified all
examinations and tests shall be made under the following conditions:
5.1 Packaqing. Requirements for packaging shall be in
accordance with MIL-M-38510, including provisions for electrostatic
protection and MIL-M-55565. Shipping of classified materials shall
conform to the requirements established by the Department of Defense
for confidential materials using the signature security service.