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| ![]() MIL-M-63320A(AR)
4 . 4 Quality conformance inspection.
4.4.1 I n s p e c t i o n lot formation. I n s p e c t i o n lot fomation shall
be as defined in MIL-M-38510 for Class B devices.
4.4.2
Examinations,
Quality conformance inspection. Quality conformance
a.
inspection
s h a l l consist of the inspections specified for Group A
B and when required Group C. Quality conformance
and Croup
requirements s h a l l be in accordance with the Classifi-
inspection
c a t i o n of
Defects and Test paragraph 4.4.2.1 through 4.4.2.4.
h. I n s p e c t i o n requirements. I n s p e c t i o n requirements for this
device shall he in accordance with the requirements of MIL-M-38510
and MTL-STD-883, Method 5005 for Groups A, B. and C tests except as
m o d i f i e d herein. S e e 4.4.2.1 thru 4.4.2.4.
c . Screening shall be performed on all devices in accordance
w i t h the inspection f l o w specified in 4.4.2.1.
d. Sampling. I n s p e c t i o n samples of devices required by this
s p e c i f i c a t i o n s h a l l be randomly selected from each inspection lot in
accordance with Appendix B-1 of MIL-M-38510
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