Mine, Antipersonnel M86, Demonstration Mine

• Mine, Antipersonnel M86, Demonstration Mine
• Other Government documents, drawings, and publications.
• Function of sensor assembly.
• Soldered electrical connections.
• Void criteria for molded assembly.
• Qualification testing of electrical components.
• Workmanship - parts and assemblies.
• Classification of inspections.
• Inspections to be performed.
• Table 1. First article testing
• Lot acceptance testing.
• Classification of Defects
• Manifold Assembly, Center
• Manifold Assembly, Side
• Diaphragm
• Sensor Assembly
• Can, Switch
• Switch Assembly
• Printed Wire Board Assembly Interconnect
• Dual Transistor, NPN Darlington
• Capacitor, Tantalum, Dual, Dip Case
• Capacitor, Fixed, Tantalum, Solid Polarized
• Capacitor, Fixed Plastic Dielectric
• Resistor, Network, Thickfilm
• Integrated Circuit, Control and Timing Base CMOS
• Printed Wiring Board Assembly
• S&A and Laminate Assembly
• S&A Assembly, PDM
• Sleeve, S&A
• Clip, Terminal
• Wire, Housing
• Preform Assembly
• Molded Assembly
• Molded Assembly
• Molded Assembly-cont.
• Molded Assembly-cont.
• Mine Assembly Demonstrator, PDM
• Bag Assembly Demonstration Mine for M86
• Demonstration Mine with Bandoleer for M86 APERS Mine
• Packing and Marking for Shipping & storage container, PA 19 for Mine APERS 86 Classroom model
• Packing & Marking for Box Wirebound for Mine, APERS M86, Classroom model, Special test Mine, Demonstration Mine
• Anti-disturbance functioning.
• Sensor intrusion test.
• Qualification test of electric detonator, transfer lead assembly and lead cup assembly lots.
• Release and thread security of sensor assembly.
• Breakwire function of sensor assembly.
• Anti-disturbance switch.
• Quality controls for each molding compound batch for housing or plug.
• Functioning of the electronic circuitry of the molded assembly.
• Functioning of the electronic circuitry of the molded assembly-cont.
• Mine functioning.
• Hazardous dud evaluation procedure.
• Slider integrity.
• Molding compound batch definition.
• Electronic Assembly (P/N 93666912), Test Procedure
• Test Requirements
• Figure 1. Oscillator Frequency Measurement.
• Group 1. (TA=+25C) Qualification and Lot Acceptance Tests
• Group II. (Temperature-Voltage Limits) Qualification Tests Only
• System operating current.
• 40.2.3 Self-destruct time out.
• Detonator and gas generator logic.
• Figure 5. Input Wave Forms
• Figure 7. L.V.D. level measurement.
• Figure 8. Output capacitor voltage measurement.
• Detonator firing circuit.
• Gas generator firing circuit.
• Figure 11. Breakwire continuity check.
• Capacitor clamp time delay measurement.
• Anti-disturbance switch operation.
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• Standardization Document Improvement Proposal
• Instructions
• Blank Page

Mine, Antipersonnel M86, Demonstration Mine

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